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James M LeBeau

Showing results (1-10 of 55) with videos related to

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Ultramicroscopy|December 2, 2015
Characterizing the response of a scintillator-based detector to single electronsXiahan Sang, James M LeBeau
Ultramicroscopy|August 19, 2008
Experimental quantification of annular dark-field images in scanning transmission electron microscopyJames M Lebeau, Susanne Stemmer
Ultramicroscopy|January 22, 2014
Revolving scanning transmission electron microscopy: correcting sample drift distortion without prior knowledgeXiahan Sang, James M LeBeau
Ultramicroscopy|November 20, 2022
Correlating local chemical and structural order using Geographic Information Systems-based spatial statisticsMichael Xu, Abinash Kumar, James M LeBeau
Npj Computational Materials|February 16, 2026
phaser: a unified and extensible framework for fast electron ptychographyColin Gilgenbach, Menglin Zhu, James M LeBeau
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 15, 2024
A Methodology for Robust Multislice PtychographyColin Gilgenbach, Xi Chen, James M LeBeau
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 5, 2022
Towards Augmented Microscopy with Reinforcement Learning-Enhanced WorkflowsMichael Xu, Abinash Kumar, James M LeBeau
Physical Review Letters|March 8, 2024
Modeling Temperature-Dependent Electron Thermal Diffuse Scattering via Machine-Learned Interatomic Potentials and Path-Integral Molecular DynamicsDennis S Kim, Michael Xu, James M LeBeau
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 18, 2014
Atom column indexing: atomic resolution image analysis through a matrix representationXiahan Sang, Adedapo A Oni, James M LeBeau
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 27, 2025
Optimizing Atomic Number Contrast in Multislice Electron PtychographyBridget R Denzer, Colin Gilgenbach, James M LeBeau
Pageof 6

Showing results (1-10 of 55) with videos related to

Sort By:
Pageof 6
Ultramicroscopy|December 2, 2015
Characterizing the response of a scintillator-based detector to single electronsXiahan Sang, James M LeBeau
Ultramicroscopy|August 19, 2008
Experimental quantification of annular dark-field images in scanning transmission electron microscopyJames M Lebeau, Susanne Stemmer
Ultramicroscopy|January 22, 2014
Revolving scanning transmission electron microscopy: correcting sample drift distortion without prior knowledgeXiahan Sang, James M LeBeau
Ultramicroscopy|November 20, 2022
Correlating local chemical and structural order using Geographic Information Systems-based spatial statisticsMichael Xu, Abinash Kumar, James M LeBeau
Npj Computational Materials|February 16, 2026
phaser: a unified and extensible framework for fast electron ptychographyColin Gilgenbach, Menglin Zhu, James M LeBeau
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 15, 2024
A Methodology for Robust Multislice PtychographyColin Gilgenbach, Xi Chen, James M LeBeau
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 5, 2022
Towards Augmented Microscopy with Reinforcement Learning-Enhanced WorkflowsMichael Xu, Abinash Kumar, James M LeBeau
Physical Review Letters|March 8, 2024
Modeling Temperature-Dependent Electron Thermal Diffuse Scattering via Machine-Learned Interatomic Potentials and Path-Integral Molecular DynamicsDennis S Kim, Michael Xu, James M LeBeau
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 18, 2014
Atom column indexing: atomic resolution image analysis through a matrix representationXiahan Sang, Adedapo A Oni, James M LeBeau
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 27, 2025
Optimizing Atomic Number Contrast in Multislice Electron PtychographyBridget R Denzer, Colin Gilgenbach, James M LeBeau
Pageof 6