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Ultramicroscopy|March 1, 2011
Imaging modes for potential mapping in semiconductor devices by electron holography with improved lateral resolutionJan Sickmann, Petr Formánek, Martin Linck, et al.Journal of Electron Microscopy|August 27, 2005
2D-mapping of dopant distribution in deep sub micron CMOS devices by electron holography using adapted FIB-preparationAndreas Lenk, Hannes Lichte, Uwe MuehlePhilosophical Transactions. Series A, Mathematical, Physical, and Engineering Sciences|August 19, 2009
Off-axis electron holography in an aberration-corrected transmission electron microscopeHannes Lichte, Dorin Geiger, Martin LinckMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 6, 2010
Aberration correction and electron holographyHannes Lichte, Martin Linck, Dorin Geiger, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 22, 2007
Electron holography with a Cs-corrected transmission electron microscopeDorin Geiger, Hannes Lichte, Martin Linck, et al.Philosophical Transactions. Series A, Mathematical, Physical, and Engineering Sciences|June 14, 2003
Electron interference: mystery and realityHannes LichteUltramicroscopy|January 28, 2015
A flexible multi-stimuli in situ (S)TEM: concept, optical performance, and outlookFelix Börrnert, Heiko Müller, Thomas Riedel, et al.Ultramicroscopy|July 9, 2013
Electron holography for fields in solids: problems and progressHannes Lichte, Felix Börrnert, Andreas Lenk, et al.Pageof 4