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Janusz Bogdanowicz

Showing results (1-10 of 9) with videos related to

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Optics Express|April 1, 2020
Size-dependent optical properties of periodic arrays of semiconducting nanolinesAndrzej Gawlik, Janusz Bogdanowicz, Andreas Schulze, et al.
Applied Optics|September 14, 2023
Photonic metamaterial with a subwavelength electrode patternGuillaume Croes, Renaud Puybaret, Janusz Bogdanowicz, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 6, 2024
Influence of the Emitter Shape on the Field-of-View in Atom Probe TomographyMasoud Dialameh, Yu-Ting Ling, Janusz Bogdanowicz, et al.
Ultramicroscopy|January 10, 2020
Potential sources of compositional inaccuracy in the atom probe tomography of In<sub>x</sub>Ga<sub>1-x</sub>AsRamya Cuduvally, Richard J H Morris, Piero Ferrari, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 28, 2022
A Bottom-Up Volume Reconstruction Method for Atom Probe TomographyYu-Ting Ling, Siegfried Cools, Janusz Bogdanowicz, et al.
Beilstein Journal of Nanotechnology|August 18, 2018
A variable probe pitch micro-Hall effect methodMaria-Louise Witthøft, Frederik W Østerberg, Janusz Bogdanowicz, et al.
Nano Letters|January 17, 2024
Taming the Distribution of Light in Gate-All-Around Semiconductor DevicesJanusz Bogdanowicz, Thomas Nuytten, Andrzej Gawlik, et al.
Nanotechnology|April 5, 2024
Reference-free x-ray fluorescence analysis with a micrometer-sized incident beamPhilipp Hönicke, André Wählisch, Rainer Unterumsberger, et al.
Beilstein Journal of Nanotechnology|July 18, 2018
Electrical characterization of single nanometer-wide Si fins in dense arraysSteven Folkersma, Janusz Bogdanowicz, Andreas Schulze, et al.
Pageof 1

Showing results (1-10 of 9) with videos related to

Sort By:
Pageof 1
Optics Express|April 1, 2020
Size-dependent optical properties of periodic arrays of semiconducting nanolinesAndrzej Gawlik, Janusz Bogdanowicz, Andreas Schulze, et al.
Applied Optics|September 14, 2023
Photonic metamaterial with a subwavelength electrode patternGuillaume Croes, Renaud Puybaret, Janusz Bogdanowicz, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 6, 2024
Influence of the Emitter Shape on the Field-of-View in Atom Probe TomographyMasoud Dialameh, Yu-Ting Ling, Janusz Bogdanowicz, et al.
Ultramicroscopy|January 10, 2020
Potential sources of compositional inaccuracy in the atom probe tomography of In<sub>x</sub>Ga<sub>1-x</sub>AsRamya Cuduvally, Richard J H Morris, Piero Ferrari, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 28, 2022
A Bottom-Up Volume Reconstruction Method for Atom Probe TomographyYu-Ting Ling, Siegfried Cools, Janusz Bogdanowicz, et al.
Beilstein Journal of Nanotechnology|August 18, 2018
A variable probe pitch micro-Hall effect methodMaria-Louise Witthøft, Frederik W Østerberg, Janusz Bogdanowicz, et al.
Nano Letters|January 17, 2024
Taming the Distribution of Light in Gate-All-Around Semiconductor DevicesJanusz Bogdanowicz, Thomas Nuytten, Andrzej Gawlik, et al.
Nanotechnology|April 5, 2024
Reference-free x-ray fluorescence analysis with a micrometer-sized incident beamPhilipp Hönicke, André Wählisch, Rainer Unterumsberger, et al.
Beilstein Journal of Nanotechnology|July 18, 2018
Electrical characterization of single nanometer-wide Si fins in dense arraysSteven Folkersma, Janusz Bogdanowicz, Andreas Schulze, et al.
Pageof 1