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Jason P Campbell

Showing results (1-10 of 13) with videos related to

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Micromachines|April 5, 2020
Nanoscale MOSFET as a Potential Room-Temperature Quantum Current SourceKin P Cheung, Chen Wang, Jason P Campbell
IEEE Transactions on Electron Devices|January 30, 2018
Local field effect on charge-capture/emission dynamicsKin P Cheung, Dmitry Veksler, Jason P Campbell
ACS Sensors|April 24, 2026
Electron Spin Resonance Sensor for Portable and Adaptable Retrospective DosimetryPragya R Shrestha, Kin P Cheung, Robert Gougelet, et al.
IEEE Transactions on Electron Devices|June 13, 2024
Analysis and Control of RRAM Overshoot CurrentPragya R Shrestha, David M Nminibapiel, Jason P Campbell, et al.
Advanced Functional Materials|May 14, 2019
Ferroelectricity in Polar Polymer-based FETs: A Hysteresis AnalysisVasileia Georgiou, Dmitry Veksler, Jason P Campbell, et al.
Advanced Functional Materials|October 24, 2024
Highly Efficient Rapid Annealing of Thin Polar Polymer Film Ferroelectric Devices at Sub-Glass Transition TemperatureVasileia Georgiou, Dmitry Veksler, Jason T Ryan, et al.
IEEE Transactions on Electron Devices|June 6, 2017
Rapid and Accurate C-V MeasurementsJi-Hong Kim, Pragya R Shrestha, Jason P Campbell, et al.
The Review of Scientific Instruments|February 3, 2019
Slow- and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor wafer-probing stationDuane J McCrory, Mark A Anders, Jason T Ryan, et al.
Analytical Chemistry|April 14, 2015
Electron spin resonance scanning probe spectroscopy for ultrasensitive biochemical studiesJason P Campbell, Jason T Ryan, Pragya R Shrestha, et al.
Analytical Chemistry|August 6, 2019
Nonresonant Transmission Line Probe for Sensitive Interferometric Electron Spin Resonance DetectionPragya R Shrestha, Nandita Abhyankar, Mark A Anders, et al.
Pageof 2

Showing results (1-10 of 13) with videos related to

Sort By:
Pageof 2
Micromachines|April 5, 2020
Nanoscale MOSFET as a Potential Room-Temperature Quantum Current SourceKin P Cheung, Chen Wang, Jason P Campbell
IEEE Transactions on Electron Devices|January 30, 2018
Local field effect on charge-capture/emission dynamicsKin P Cheung, Dmitry Veksler, Jason P Campbell
ACS Sensors|April 24, 2026
Electron Spin Resonance Sensor for Portable and Adaptable Retrospective DosimetryPragya R Shrestha, Kin P Cheung, Robert Gougelet, et al.
IEEE Transactions on Electron Devices|June 13, 2024
Analysis and Control of RRAM Overshoot CurrentPragya R Shrestha, David M Nminibapiel, Jason P Campbell, et al.
Advanced Functional Materials|May 14, 2019
Ferroelectricity in Polar Polymer-based FETs: A Hysteresis AnalysisVasileia Georgiou, Dmitry Veksler, Jason P Campbell, et al.
Advanced Functional Materials|October 24, 2024
Highly Efficient Rapid Annealing of Thin Polar Polymer Film Ferroelectric Devices at Sub-Glass Transition TemperatureVasileia Georgiou, Dmitry Veksler, Jason T Ryan, et al.
IEEE Transactions on Electron Devices|June 6, 2017
Rapid and Accurate C-V MeasurementsJi-Hong Kim, Pragya R Shrestha, Jason P Campbell, et al.
The Review of Scientific Instruments|February 3, 2019
Slow- and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor wafer-probing stationDuane J McCrory, Mark A Anders, Jason T Ryan, et al.
Analytical Chemistry|April 14, 2015
Electron spin resonance scanning probe spectroscopy for ultrasensitive biochemical studiesJason P Campbell, Jason T Ryan, Pragya R Shrestha, et al.
Analytical Chemistry|August 6, 2019
Nonresonant Transmission Line Probe for Sensitive Interferometric Electron Spin Resonance DetectionPragya R Shrestha, Nandita Abhyankar, Mark A Anders, et al.
Pageof 2