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Jason P Campbell

Showing results (11-20 of 13) with videos related to

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IEEE Transactions on Device and Materials Reliability : a Publication of the IEEE Electron Devices Society and the IEEE Reliability Society|April 16, 2019
Wafer-Level Electrically Detected Magnetic Resonance: Magnetic Resonance in a Probing StationDuane J McCrory, Mark A Anders, Jason T Ryan, et al.
IEEE Electron Device Letters : a Publication of the IEEE Electron Devices Society|September 12, 2017
Impact of RRAM Read Fluctuations on the Program-Verify ApproachDavid M Nminibapiel, Dmitry Veksler, J-H Kim, et al.
AIP Advances|November 25, 2016
Observation of Strong Reflection of Electron Waves Exiting a Ballistic Channel at Low EnergyCanute I Vaz, Changze Liu, Jason P Campbell, et al.
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Showing results (11-20 of 13) with videos related to

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Pageof 2
You have reached the last page of results.This site can display upto 13 results.
IEEE Transactions on Device and Materials Reliability : a Publication of the IEEE Electron Devices Society and the IEEE Reliability Society|April 16, 2019
Wafer-Level Electrically Detected Magnetic Resonance: Magnetic Resonance in a Probing StationDuane J McCrory, Mark A Anders, Jason T Ryan, et al.
IEEE Electron Device Letters : a Publication of the IEEE Electron Devices Society|September 12, 2017
Impact of RRAM Read Fluctuations on the Program-Verify ApproachDavid M Nminibapiel, Dmitry Veksler, J-H Kim, et al.
AIP Advances|November 25, 2016
Observation of Strong Reflection of Electron Waves Exiting a Ballistic Channel at Low EnergyCanute I Vaz, Changze Liu, Jason P Campbell, et al.
Pageof 2