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Impact of RRAM Read Fluctuations on the Program-Verify Approach

David M Nminibapiel1, Dmitry Veksler2, J-H Kim2

  • 1Engineering Physics Division at National Institute Standards and Technology (NIST), Gaithersburg, MD 20899 USA.

IEEE Electron Device Letters : a Publication of the IEEE Electron Devices Society
|September 12, 2017
PubMed

Keywords:
FluctuationsInstabilityProgram-VerifyRRAMRelaxation

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