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Nanoscale Advances|September 22, 2022
Electrostatically-blind quantitative piezoresponse force microscopy free of distributed-force artifactsJason P Killgore, Larry Robins, Liam CollinsApplied Physics Letters|October 18, 2016
Photothermally excited force modulation microscopy for broadband nanomechanical property measurementsRyan Wagner, Jason P KillgoreLangmuir : the ACS Journal of Surfaces and Colloids|February 16, 2008
Interfacial mobility and bonding strength in nanocomposite thin film membranesJason P Killgore, René M OverneyNanotechnology|January 13, 2012
Low-force AFM nanomechanics with higher-eigenmode contact resonance spectroscopyJason P Killgore, Donna C HurleyNanotechnology|August 8, 2014
Characterizing the free and surface-coupled vibrations of heated-tip atomic force microscope cantileversJason P Killgore, Ryan C Tung, Donna C HurleyThe Review of Scientific Instruments|August 2, 2013
Hydrodynamic corrections to contact resonance atomic force microscopy measurements of viscoelastic loss tangentRyan C Tung, Jason P Killgore, Donna C HurleyLangmuir : the ACS Journal of Surfaces and Colloids|October 2, 2015
Quantitative Contact Resonance Force Microscopy for Viscoelastic Measurement of Soft Materials at the Solid-Liquid InterfaceAllison B Churnside, Ryan C Tung, Jason P KillgoreAdditive Manufacturing|July 16, 2021
Digital light processing in a hybrid atomic force microscope: <i>In Situ</i>, nanoscale characterization of the printing processCallie I Higgins, Tobin E Brown, Jason P KillgoreBeilstein Journal of Nanotechnology|March 31, 2018
Scanning speed phenomenon in contact-resonance atomic force microscopyChristopher C Glover, Jason P Killgore, Ryan C TungACS Applied Materials & Interfaces|September 2, 2020
Revealing Antiferroelectric Switching and Ferroelectric Wakeup in Hafnia by Advanced Piezoresponse Force MicroscopyLiam Collins, Umberto CelanoPageof 12