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Scanning speed phenomenon in contact-resonance atomic force microscopy

Christopher C Glover1, Jason P Killgore2, Ryan C Tung1

  • 1Department of Mechanical Engineering, University of Nevada, Reno, 1664 N Virginia St, Reno, NV 89557, USA.

Beilstein Journal of Nanotechnology
|March 31, 2018
PubMed

Keywords:
atomic force microscopecontact resonanceliquidphenomenonscan speed

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