Investigating physico-chemo-mechanical changes of eutectic gallium indium (eGaIn) thin films induced by fluorinated...

Area of Science:

• Materials Science
• Analytical Chemistry
• Environmental Science

Background:

• Per- and polyfluorinated alkyl substances (PFAS) are persistent environmental contaminants requiring sensitive detection methods.
• Existing analytical techniques for PFAS can be time-consuming and expensive.
• Developing rapid, field-deployable sensors for organofluorine compounds is crucial.

Purpose of the Study:

• To demonstrate a novel sensing mechanism for dilute fluorinated compounds using 2D eGaIn thin films.
• To investigate the interfacial interactions between eGaIn and PFAS leading to delamination.
• To establish a rapid, low-cost method for total organofluorine detection.

Main Methods:

• Utilizing the chemical sensitivity and mechanical stability of 2D eutectic gallium indium (eGaIn) thin films.
• Inducing thin film delamination via interfacial interactions with PFAS microdroplets.
• Employing energy-dispersive X-ray spectroscopy (EDS) and Raman spectroscopy for analysis.

Main Results:

• Demonstrated delamination of eGaIn films upon exposure to PFAS.
• Showcased sensitivity to varying concentrations of fluorinated compounds (PFOA, PFAS).
• Quantified shifts in elemental distribution and surface dynamics using EDS and Raman spectroscopy.

Conclusions:

• The developed method offers a rapid *in situ* analysis tool for PFAS detection.
• The delamination phenomenon provides a visual indicator of organofluorine presence.
• This approach complements existing technologies and enables low-cost, field-deployable sensors for total organofluorine detection.