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Scientific Reports|April 9, 2022
Characterization of internal fatigue cracks in aluminum alloys by simulation of phase contrast tomographyCe Xiao, Jean Michel Létang, Jean-Yves BuffièreJournal of Synchrotron Radiation|December 24, 2016
On the use of flat-fields for tomographic reconstructionClément Jailin, Jean Yves Buffière, François Hild, et al.Medical Engineering & Physics|December 2, 2006
X-ray micro-tomography of a coronary stent deployed in a model arteryThomas Connolley, Derek Nash, Jean-Yves Buffière, et al.Pageof 1