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Published on: August 21, 2019
On the use of flat-fields for tomographic reconstruction
Clément Jailin1, Jean Yves Buffière2, François Hild1
1LMT (ENS Cachan/CNRS/Université Paris-Saclay), 61 avenue du Président Wilson, F-94235 Cachan, France.
This study introduces a fast method to estimate incident beam intensity for tomographic imaging, reducing reconstruction artifacts like ring artifacts. The technique improves quantitative imaging by correcting detector imperfections without altering data acquisition.
Area of Science:
- Medical Imaging
- Physics
- Materials Science
Background:
- Quantitative tomographic imaging requires minimizing reconstruction artifacts.
- Detector imperfections and beam inhomogeneity cause significant reconstruction bias, such as ring artifacts, in synchrotron-based imaging.
- Temporal variations in beam characteristics further exacerbate these issues.
Purpose of the Study:
- To propose a method for estimating local incident beam intensity per projection during tomographic scans.
- To develop a technique that corrects for detector imperfections and beam variations without modifying the data acquisition process.
- To improve the accuracy of quantitative tomographic reconstructions.
Main Methods:
- Exploiting actual flat-field images and sinogram borders to construct an instantaneous, detector-wide flat-field.
- Implementing a fast and simple data processing treatment.
- Assessing performance using residuals (difference between reconstructed and actual projections).
Main Results:
- The proposed method effectively estimates instantaneous detector-wide flat-fields.
- Artifacts, particularly ring artifacts, are significantly reduced in the reconstructed images.
- Residual analysis confirms the accuracy and benefit of the developed procedure.
Conclusions:
- The presented method offers a computationally efficient and effective solution for correcting beam-related artifacts in tomographic imaging.
- This approach enhances the quality and reliability of quantitative tomographic data, especially from synchrotron sources.
- The technique is readily applicable and improves the fidelity of reconstructed images.
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