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Jeffrey A Jargon

Showing results (1-10 of 7) with videos related to

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Journal of Research of the National Institute of Standards and Technology|January 6, 2017
High Power CW Wattmeter Calibration at NISTGregorio Rebuldela, Jeffrey A Jargon
Journal of Research of the National Institute of Standards and Technology|July 5, 2023
The NIST 30 MHz Linear Measurement SystemJeffrey A Jargon, Ronald A Ginley, Douglas D Sutton
Journal of Research of the National Institute of Standards and Technology|July 2, 2016
Frequency-Domain Models for Nonlinear Microwave Devices Based on Large-Signal MeasurementsJeffrey A Jargon, Donald C DeGroot, K C Gupta
IEEE Transactions on Microwave Theory and Techniques|January 13, 2022
Influence of Noise on Scattering-Parameter MeasurementsDazhen Gu, Jeffrey A Jargon, Matthew J Ryan, et al.
Optics Express|April 15, 2010
Optical performance monitoring of QPSK data channels by use of neural networks trained with parameters derived from asynchronous constellation diagramsJeffrey A Jargon, Xiaoxia Wu, Hyeon Yeong Choi, et al.
IEEE Transactions on Microwave Theory and Techniques|January 25, 2021
Precision Millimeter-Wave-Modulated Wideband Source at 92.4 GHz as a Step Toward an Over-the-Air ReferenceParitosh Manurkar, Robert D Horansky, Benjamin F Jamroz, et al.
IEEE Transactions on Instrumentation and Measurement|March 18, 2024
Calibration of Time-Interleaved Errors in Digital Real-Time OscilloscopesChihyun Cho, Joo Gwang Lee, Paul D Hale, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Journal of Research of the National Institute of Standards and Technology|January 6, 2017
High Power CW Wattmeter Calibration at NISTGregorio Rebuldela, Jeffrey A Jargon
Journal of Research of the National Institute of Standards and Technology|July 5, 2023
The NIST 30 MHz Linear Measurement SystemJeffrey A Jargon, Ronald A Ginley, Douglas D Sutton
Journal of Research of the National Institute of Standards and Technology|July 2, 2016
Frequency-Domain Models for Nonlinear Microwave Devices Based on Large-Signal MeasurementsJeffrey A Jargon, Donald C DeGroot, K C Gupta
IEEE Transactions on Microwave Theory and Techniques|January 13, 2022
Influence of Noise on Scattering-Parameter MeasurementsDazhen Gu, Jeffrey A Jargon, Matthew J Ryan, et al.
Optics Express|April 15, 2010
Optical performance monitoring of QPSK data channels by use of neural networks trained with parameters derived from asynchronous constellation diagramsJeffrey A Jargon, Xiaoxia Wu, Hyeon Yeong Choi, et al.
IEEE Transactions on Microwave Theory and Techniques|January 25, 2021
Precision Millimeter-Wave-Modulated Wideband Source at 92.4 GHz as a Step Toward an Over-the-Air ReferenceParitosh Manurkar, Robert D Horansky, Benjamin F Jamroz, et al.
IEEE Transactions on Instrumentation and Measurement|March 18, 2024
Calibration of Time-Interleaved Errors in Digital Real-Time OscilloscopesChihyun Cho, Joo Gwang Lee, Paul D Hale, et al.
Pageof 1