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Langmuir : the ACS Journal of Surfaces and Colloids|February 17, 2017
Surface Energy in Nanocrystalline Carbon Thin Films: Effect of Size Dependence and Atmospheric ExposureManish Kumar, Amjed Javid, Jeon Geon Han
Physical Chemistry Chemical Physics : PCCP|February 8, 2017
Shaping thin film growth and microstructure pathways via plasma and deposition energy: a detailed theoretical, computational and experimental analysisBibhuti Bhusan Sahu, Jeon Geon Han, Holger Kersten
Physical Chemistry Chemical Physics : PCCP|February 1, 2018
Development and utility of a new 3-D magnetron source for high rate deposition of highly conductive ITO thin films near room temperatureLong Wen, Bibhuti Bhusan Sahu, Jeon Geon Han
Journal of Nanoscience and Nanotechnology|February 17, 2018
Multi c-BN Coatings by r.f Diode Sputtering and Investigation of Wear BehaviorSung-Tae Park, Jeon-Geon Han, M Keunecke
Physical Chemistry Chemical Physics : PCCP|November 17, 2016
Simple realization of efficient barrier performance of a single layer silicon nitride film via plasma chemistryJun Suk Lee, Bibhuti Bhusan Sahu, Jeon Geon Han
Physical Chemistry Chemical Physics : PCCP|May 27, 2016
Low temperature synthesis of silicon quantum dots with plasma chemistry control in dual frequency non-thermal plasmasBibhuti Bhusan Sahu, Yongyi Yin, Jeon Geon Han, et al.
The Review of Scientific Instruments|September 7, 2018
Plasma-enhanced reactive linear sputtering source for formation of silicon-based thin filmsKosuke Takenaka, Yuichi Setsuhara, Jeon Geon Han, et al.
Physical Chemistry Chemical Physics : PCCP|October 7, 2016
Plasma engineering of silicon quantum dots and their properties through energy deposition and chemistryBibhuti Bhusan Sahu, Yongyi Yin, Sven Gauter, et al.
Physical Chemistry Chemical Physics : PCCP|December 1, 2016
Size-controlled growth and antibacterial mechanism for Cu:C nanocomposite thin filmsAmjed Javid, Manish Kumar, Seokyoung Yoon, et al.
Nanoscale|May 18, 2017
Systematic study of interdependent relationship on gold nanorod synthesis assisted by electron microscopy image analysisSeokyoung Yoon, Byoungsang Lee, Jaesub Yun, et al.
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