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Jeongho Ahn

Showing results (1-10 of 5) with videos related to

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Optics Express|December 24, 2008
Efficient double-filtering with a single acousto-optic tunable filterJang-Woo You, Jeongho Ahn, Soohyun Kim, et al.
Optics Express|January 7, 2010
A passive method to compensate nonlinearity in a homodyne interferometerJeongho Ahn, Jong-Ahn Kim, Chu-Shik Kang, et al.
Optics Express|December 10, 2009
High resolution interferometer with multiple-pass optical configurationJeongho Ahn, Jong-Ahn Kim, Chu-Shik Kang, et al.
Light, Science & Applications|May 28, 2024
Microsphere-assisted hyperspectral imaging: super-resolution, non-destructive metrology for semiconductor devicesJangryul Park, Youngsun Choi, Soonyang Kwon, et al.
Nature Communications|September 26, 2025
Ultra-wide-field imaging Mueller matrix spectroscopic ellipsometry for semiconductor metrologyJuntaek Oh, Jaehyeon Son, Changhyeong Yoon, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Optics Express|December 24, 2008
Efficient double-filtering with a single acousto-optic tunable filterJang-Woo You, Jeongho Ahn, Soohyun Kim, et al.
Optics Express|January 7, 2010
A passive method to compensate nonlinearity in a homodyne interferometerJeongho Ahn, Jong-Ahn Kim, Chu-Shik Kang, et al.
Optics Express|December 10, 2009
High resolution interferometer with multiple-pass optical configurationJeongho Ahn, Jong-Ahn Kim, Chu-Shik Kang, et al.
Light, Science & Applications|May 28, 2024
Microsphere-assisted hyperspectral imaging: super-resolution, non-destructive metrology for semiconductor devicesJangryul Park, Youngsun Choi, Soonyang Kwon, et al.
Nature Communications|September 26, 2025
Ultra-wide-field imaging Mueller matrix spectroscopic ellipsometry for semiconductor metrologyJuntaek Oh, Jaehyeon Son, Changhyeong Yoon, et al.
Pageof 1