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Jeremiah Croshaw

Showing results (1-10 of 7) with videos related to

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Beilstein Journal of Nanotechnology|September 25, 2020
Atomic defect classification of the H-Si(100) surface through multi-mode scanning probe microscopyJeremiah Croshaw, Thomas Dienel, Taleana Huff, et al.
ACS Nano|November 28, 2019
Detecting and Directing Single Molecule Binding Events on H-Si(100) with Application to Ultradense Data StorageRoshan Achal, Mohammad Rashidi, Jeremiah Croshaw, et al.
Nanoscale|February 3, 2021
Ionic charge distributions in silicon atomic surface wiresJeremiah Croshaw, Taleana Huff, Mohammad Rashidi, et al.
ACS Nano|August 7, 2019
Electrostatic Landscape of a Hydrogen-Terminated Silicon Surface Probed by a Moveable Quantum DotTaleana R Huff, Thomas Dienel, Mohammad Rashidi, et al.
Nature Communications|July 25, 2018
Lithography for robust and editable atomic-scale silicon devices and memoriesRoshan Achal, Mohammad Rashidi, Jeremiah Croshaw, et al.
Nanotechnology|January 29, 2025
Electronic structures of atomic silicon dimer wires as a function of lengthFurkan M Altincicek, Lucian Livadaru, Christopher C Leon, et al.
ACS Nano|February 20, 2024
Atomically Precise Manufacturing of Silicon ElectronicsJason Pitters, Jeremiah Croshaw, Roshan Achal, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Beilstein Journal of Nanotechnology|September 25, 2020
Atomic defect classification of the H-Si(100) surface through multi-mode scanning probe microscopyJeremiah Croshaw, Thomas Dienel, Taleana Huff, et al.
ACS Nano|November 28, 2019
Detecting and Directing Single Molecule Binding Events on H-Si(100) with Application to Ultradense Data StorageRoshan Achal, Mohammad Rashidi, Jeremiah Croshaw, et al.
Nanoscale|February 3, 2021
Ionic charge distributions in silicon atomic surface wiresJeremiah Croshaw, Taleana Huff, Mohammad Rashidi, et al.
ACS Nano|August 7, 2019
Electrostatic Landscape of a Hydrogen-Terminated Silicon Surface Probed by a Moveable Quantum DotTaleana R Huff, Thomas Dienel, Mohammad Rashidi, et al.
Nature Communications|July 25, 2018
Lithography for robust and editable atomic-scale silicon devices and memoriesRoshan Achal, Mohammad Rashidi, Jeremiah Croshaw, et al.
Nanotechnology|January 29, 2025
Electronic structures of atomic silicon dimer wires as a function of lengthFurkan M Altincicek, Lucian Livadaru, Christopher C Leon, et al.
ACS Nano|February 20, 2024
Atomically Precise Manufacturing of Silicon ElectronicsJason Pitters, Jeremiah Croshaw, Roshan Achal, et al.
Pageof 1