Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Jill Serron

Showing results (1-10 of 5) with videos related to

Pageof 1
Sort By:
Nanotechnology|March 24, 2024
Probe chip nanofabrication enabled reverse tip sample scanning probe microscopy concept and measurementsHyeon-Su Kim, Nemanja Peric, Albert Minj, et al.
ACS Applied Materials & Interfaces|April 6, 2021
Mitigating Dark Current for High-Performance Near-Infrared Organic Photodiodes via Charge Blocking and Defect PassivationWeitao Yang, Weiming Qiu, Epimitheas Georgitzikis, et al.
ACS Nano|April 1, 2024
Direct Assessment of Defective Regions in Monolayer MoS<sub>2</sub> Field-Effect Transistors through <i>In Situ</i> Scanning Probe Microscopy MeasurementsAlbert Minj, Vivek Mootheri, Sreetama Banerjee, et al.
ACS Nano|May 27, 2021
Engineering Wafer-Scale Epitaxial Two-Dimensional Materials through Sapphire Template Screening for Advanced High-Performance NanoelectronicsYuanyuan Shi, Benjamin Groven, Jill Serron, et al.
ACS Applied Materials & Interfaces|May 17, 2023
Conductivity Enhancement in Transition Metal Dichalcogenides: A Complex Water Intercalation and Desorption MechanismJill Serron, Albert Minj, Valentina Spampinato, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Nanotechnology|March 24, 2024
Probe chip nanofabrication enabled reverse tip sample scanning probe microscopy concept and measurementsHyeon-Su Kim, Nemanja Peric, Albert Minj, et al.
ACS Applied Materials & Interfaces|April 6, 2021
Mitigating Dark Current for High-Performance Near-Infrared Organic Photodiodes via Charge Blocking and Defect PassivationWeitao Yang, Weiming Qiu, Epimitheas Georgitzikis, et al.
ACS Nano|April 1, 2024
Direct Assessment of Defective Regions in Monolayer MoS<sub>2</sub> Field-Effect Transistors through <i>In Situ</i> Scanning Probe Microscopy MeasurementsAlbert Minj, Vivek Mootheri, Sreetama Banerjee, et al.
ACS Nano|May 27, 2021
Engineering Wafer-Scale Epitaxial Two-Dimensional Materials through Sapphire Template Screening for Advanced High-Performance NanoelectronicsYuanyuan Shi, Benjamin Groven, Jill Serron, et al.
ACS Applied Materials & Interfaces|May 17, 2023
Conductivity Enhancement in Transition Metal Dichalcogenides: A Complex Water Intercalation and Desorption MechanismJill Serron, Albert Minj, Valentina Spampinato, et al.
Pageof 1