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Ultramicroscopy|December 3, 2014
Spectrum imaging of complex nanostructures using DualEELS: I. Digital extraction replicasJoanna Bobynko, Ian MacLaren, Alan J Craven
Ultramicroscopy|December 24, 2017
Spectrum imaging of complex nanostructures using DualEELS: II. Absolute quantification using standardsAlan J Craven, Bianca Sala, Joanna Bobynko, et al.
Ultramicroscopy|August 30, 2016
Accurate measurement of absolute experimental inelastic mean free paths and EELS differential cross-sectionsAlan J Craven, Joanna Bobynko, Bianca Sala, et al.
Ultramicroscopy|August 28, 2016
Linear chemically sensitive electron tomography using DualEELS and dictionary-based compressed sensingAla AlAfeef, Joanna Bobynko, W Paul Cockshott, et al.
Ultramicroscopy|April 6, 2017
Getting the most out of a post-column EELS spectrometer on a TEM/STEM by optimising the optical couplingAlan J Craven, Hidetaka Sawada, Sam McFadzean, et al.
Microscopy (Oxford, England)|October 17, 2017
EELS at very high energy lossesIan MacLaren, Kirsty J Annand, Colin Black, et al.
Ultramicroscopy|April 8, 2025
Splicing dual-range EELS spectra: Identifying and correcting artefactsAlan J Craven, Bianca Sala, Donald A MacLaren, et al.
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