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Proceedings of the National Academy of Sciences of the United States of America
|
October 23, 2020
A symmetry-derived mechanism for atomic resolution imaging
Matus Krajnak, Joanne Etheridge
Ultramicroscopy
|
November 3, 2022
Complementary ADF-STEM: a Flexible Approach to Quantitative 4D-STEM
Bryan D Esser, Joanne Etheridge
Physical Review Letters
|
May 13, 2014
Fast imaging with inelastically scattered electrons by off-axis chromatic confocal electron microscopy
Changlin Zheng, Ye Zhu, Sorin Lazar, et al.
Iucrj
|
November 17, 2018
Three-beam convergent-beam electron diffraction for measuring crystallographic phases
Yueming Guo, Philip N H Nakashima, Joanne Etheridge
Ultramicroscopy
|
June 14, 2011
A new approach to structure amplitude determination from 3-beam convergent beam electron diffraction patterns
Philip N H Nakashima, Alexander F Moodie, Joanne Etheridge
Proceedings of the National Academy of Sciences of the United States of America
|
August 14, 2013
Direct atomic structure determination by the inspection of structural phase
Philip N H Nakashima, Alexander F Moodie, Joanne Etheridge
Ultramicroscopy
|
May 27, 2008
A practical guide to the measurement of structure phases and magnitudes by three-beam convergent beam electron diffraction
Philip N H Nakashima, Alexander F Moodie, Joanne Etheridge
Physical Review Letters
|
May 24, 2011
Imaging high-energy electrons propagating in a crystal
Joanne Etheridge, Sorin Lazar, Christian Dwyer, et al.
Acta Crystallographica. Section A, Foundations of Crystallography
|
August 19, 2007
Structural phase and amplitude measurement from distances in convergent-beam electron diffraction patterns
Philip N H Nakashima, Alexander F Moodie, Joanne Etheridge
Acta Crystallographica. Section B, Structural Science
|
March 18, 2005
Structure and microstructure of hexagonal Ba3Ti2RuO9 by electron diffraction and microscopy
Christian Maunders, Joanne Etheridge, Natasha Wright, et al.
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of 5
Search research articles
Search
Showing results (1-10 of 50) with videos related to
Sort By:
Page
of 5
Proceedings of the National Academy of Sciences of the United States of America
|
October 23, 2020
A symmetry-derived mechanism for atomic resolution imaging
Matus Krajnak, Joanne Etheridge
Ultramicroscopy
|
November 3, 2022
Complementary ADF-STEM: a Flexible Approach to Quantitative 4D-STEM
Bryan D Esser, Joanne Etheridge
Physical Review Letters
|
May 13, 2014
Fast imaging with inelastically scattered electrons by off-axis chromatic confocal electron microscopy
Changlin Zheng, Ye Zhu, Sorin Lazar, et al.
Iucrj
|
November 17, 2018
Three-beam convergent-beam electron diffraction for measuring crystallographic phases
Yueming Guo, Philip N H Nakashima, Joanne Etheridge
Ultramicroscopy
|
June 14, 2011
A new approach to structure amplitude determination from 3-beam convergent beam electron diffraction patterns
Philip N H Nakashima, Alexander F Moodie, Joanne Etheridge
Proceedings of the National Academy of Sciences of the United States of America
|
August 14, 2013
Direct atomic structure determination by the inspection of structural phase
Philip N H Nakashima, Alexander F Moodie, Joanne Etheridge
Ultramicroscopy
|
May 27, 2008
A practical guide to the measurement of structure phases and magnitudes by three-beam convergent beam electron diffraction
Philip N H Nakashima, Alexander F Moodie, Joanne Etheridge
Physical Review Letters
|
May 24, 2011
Imaging high-energy electrons propagating in a crystal
Joanne Etheridge, Sorin Lazar, Christian Dwyer, et al.
Acta Crystallographica. Section A, Foundations of Crystallography
|
August 19, 2007
Structural phase and amplitude measurement from distances in convergent-beam electron diffraction patterns
Philip N H Nakashima, Alexander F Moodie, Joanne Etheridge
Acta Crystallographica. Section B, Structural Science
|
March 18, 2005
Structure and microstructure of hexagonal Ba3Ti2RuO9 by electron diffraction and microscopy
Christian Maunders, Joanne Etheridge, Natasha Wright, et al.
Page
of 5