Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Johann Michler

Showing results (1-10 of 95) with videos related to

Pageof 10
Sort By:
Ultramicroscopy|September 30, 2018
Application of a novel compact Cs evaporator prototype for enhancing negative ion yields during FIB-TOF-SIMS analysis in high vacuumAgnieszka Priebe, Johann Michler
Materials (Basel, Switzerland)|March 11, 2023
Review of Recent Advances in Gas-Assisted Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry (FIB-TOF-SIMS)Agnieszka Priebe, Johann Michler
Analytical Chemistry|December 21, 2019
Fluorine Gas Coinjection as a Solution for Enhancing Spatial Resolution of Time-of-Flight Secondary Ion Mass Spectrometry and Separating Mass InterferenceAgnieszka Priebe, Laszlo Pethö, Johann Michler
Acta Biomaterialia|May 20, 2020
Microtensile properties and failure mechanisms of cortical bone at the lamellar levelDaniele Casari, Johann Michler, Philippe Zysset, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 23, 2020
<i>In Situ</i> Atomic Force Microscopy Depth-Corrected Three-Dimensional Focused Ion Beam Based Time-of-Flight Secondary Ion Mass Spectroscopy: Spatial Resolution, Surface Roughness, OxidationLex Pillatsch, Szilvia Kalácska, Xavier Maeder, et al.
Analytical Chemistry|August 21, 2019
Application of a Gas-Injection System during the FIB-TOF-SIMS Analysis-Influence of Water Vapor and Fluorine Gas on Secondary Ion Signals and Sputtering RatesAgnieszka Priebe, Ivo Utke, Laszlo Pethö, et al.
Micromachines|April 16, 2020
Mechanical Properties of 3D Nanostructures Obtained by Focused Electron/Ion Beam-Induced Deposition: A ReviewIvo Utke, Johann Michler, Robert Winkler, et al.
Dalton Transactions (Cambridge, England : 2003)|July 24, 2020
Molecular layer deposited alucone thin films from long-chain organic precursors: from brittle to ductile mechanical characteristicsJanne-Petteri Niemelä, Nadia Rohbeck, Johann Michler, et al.
Advanced Science (Weinheim, Baden-Wurttemberg, Germany)|January 13, 2023
Room Temperature Viscous Flow of Amorphous Silica Induced by Electron Beam IrradiationSebastian Bruns, Christian Minnert, Laszlo Pethö, et al.
Analytical Chemistry|July 14, 2021
Mechanisms of Fluorine-Induced Separation of Mass Interference during TOF-SIMS AnalysisAgnieszka Priebe, Emese Huszar, Marek Nowicki, et al.
Pageof 10

Showing results (1-10 of 95) with videos related to

Sort By:
Pageof 10
Ultramicroscopy|September 30, 2018
Application of a novel compact Cs evaporator prototype for enhancing negative ion yields during FIB-TOF-SIMS analysis in high vacuumAgnieszka Priebe, Johann Michler
Materials (Basel, Switzerland)|March 11, 2023
Review of Recent Advances in Gas-Assisted Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry (FIB-TOF-SIMS)Agnieszka Priebe, Johann Michler
Analytical Chemistry|December 21, 2019
Fluorine Gas Coinjection as a Solution for Enhancing Spatial Resolution of Time-of-Flight Secondary Ion Mass Spectrometry and Separating Mass InterferenceAgnieszka Priebe, Laszlo Pethö, Johann Michler
Acta Biomaterialia|May 20, 2020
Microtensile properties and failure mechanisms of cortical bone at the lamellar levelDaniele Casari, Johann Michler, Philippe Zysset, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 23, 2020
<i>In Situ</i> Atomic Force Microscopy Depth-Corrected Three-Dimensional Focused Ion Beam Based Time-of-Flight Secondary Ion Mass Spectroscopy: Spatial Resolution, Surface Roughness, OxidationLex Pillatsch, Szilvia Kalácska, Xavier Maeder, et al.
Analytical Chemistry|August 21, 2019
Application of a Gas-Injection System during the FIB-TOF-SIMS Analysis-Influence of Water Vapor and Fluorine Gas on Secondary Ion Signals and Sputtering RatesAgnieszka Priebe, Ivo Utke, Laszlo Pethö, et al.
Micromachines|April 16, 2020
Mechanical Properties of 3D Nanostructures Obtained by Focused Electron/Ion Beam-Induced Deposition: A ReviewIvo Utke, Johann Michler, Robert Winkler, et al.
Dalton Transactions (Cambridge, England : 2003)|July 24, 2020
Molecular layer deposited alucone thin films from long-chain organic precursors: from brittle to ductile mechanical characteristicsJanne-Petteri Niemelä, Nadia Rohbeck, Johann Michler, et al.
Advanced Science (Weinheim, Baden-Wurttemberg, Germany)|January 13, 2023
Room Temperature Viscous Flow of Amorphous Silica Induced by Electron Beam IrradiationSebastian Bruns, Christian Minnert, Laszlo Pethö, et al.
Analytical Chemistry|July 14, 2021
Mechanisms of Fluorine-Induced Separation of Mass Interference during TOF-SIMS AnalysisAgnieszka Priebe, Emese Huszar, Marek Nowicki, et al.
Pageof 10