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Johannes Biskupek

Showing results (1-10 of 76) with videos related to

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Journal of Electron Microscopy|December 8, 2004
Practical considerations on the determination of the accuracy of the lattice parameters measurements from digital recorded diffractogramsJohannes Biskupek, Ute Kaiser
Journal of Electron Microscopy|December 24, 2005
Matrix-dependent structure of GeSi nanocrystals in SiCJohannes Biskupek, Ute Kaiser, Konrad Gärtner
Micron (Oxford, England : 1993)|November 27, 2025
Application of position-averaged convergent beam electron diffraction to determine the thickness of ultra-thin materialsJohannes Biskupek, Philipp Eltgen, Ute Kaiser
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 23, 2012
Improved focused ion beam target preparation of (S)TEM specimen--a method for obtaining ultrathin lamellaeLorenz Lechner, Johannes Biskupek, Ute Kaiser
Journal of Electron Microscopy|May 28, 2008
Heat- and electron-beam-induced transport of gold particles into silicon oxide and silicon studied by in situ high-resolution transmission electron microscopyJohannes Biskupek, Ute Kaiser, Fritz Falk
Nanoscale|May 26, 2026
Divergent phase evolution in mixed oxide W<sub>0.5</sub>Mo<sub>0.5</sub>O<sub>3</sub> under electron beam irradiation and thermal annealingNaveen Goyal, Johannes Biskupek, Ute Kaiser
Ultramicroscopy|June 24, 2010
Optimization of STEM tomography acquisition--a comparison of convergent beam and parallel beam STEM tomographyJohannes Biskupek, Jens Leschner, Paul Walther, et al.
Ultramicroscopy|September 4, 2015
Critical conditions for atomic resolution imaging of molecular crystals by aberration-corrected HRTEMKaname Yoshida, Johannes Biskupek, Hiroki Kurata, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 7, 2022
Integrated Differential Phase Contrast (IDPC)-STEM Utilizing a Multi-Sector Detector for Imaging Thick SamplesZhongbo Li, Johannes Biskupek, Ute Kaiser, et al.
Nano Letters|July 1, 2024
Defect Density and Atomic Defect Recognition in the Middle Layer of a Trilayer MoS<sub>2</sub> StackMoritz Quincke, Manuel Mundszinger, Johannes Biskupek, et al.
Pageof 8

Showing results (1-10 of 76) with videos related to

Sort By:
Pageof 8
Journal of Electron Microscopy|December 8, 2004
Practical considerations on the determination of the accuracy of the lattice parameters measurements from digital recorded diffractogramsJohannes Biskupek, Ute Kaiser
Journal of Electron Microscopy|December 24, 2005
Matrix-dependent structure of GeSi nanocrystals in SiCJohannes Biskupek, Ute Kaiser, Konrad Gärtner
Micron (Oxford, England : 1993)|November 27, 2025
Application of position-averaged convergent beam electron diffraction to determine the thickness of ultra-thin materialsJohannes Biskupek, Philipp Eltgen, Ute Kaiser
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 23, 2012
Improved focused ion beam target preparation of (S)TEM specimen--a method for obtaining ultrathin lamellaeLorenz Lechner, Johannes Biskupek, Ute Kaiser
Journal of Electron Microscopy|May 28, 2008
Heat- and electron-beam-induced transport of gold particles into silicon oxide and silicon studied by in situ high-resolution transmission electron microscopyJohannes Biskupek, Ute Kaiser, Fritz Falk
Nanoscale|May 26, 2026
Divergent phase evolution in mixed oxide W<sub>0.5</sub>Mo<sub>0.5</sub>O<sub>3</sub> under electron beam irradiation and thermal annealingNaveen Goyal, Johannes Biskupek, Ute Kaiser
Ultramicroscopy|June 24, 2010
Optimization of STEM tomography acquisition--a comparison of convergent beam and parallel beam STEM tomographyJohannes Biskupek, Jens Leschner, Paul Walther, et al.
Ultramicroscopy|September 4, 2015
Critical conditions for atomic resolution imaging of molecular crystals by aberration-corrected HRTEMKaname Yoshida, Johannes Biskupek, Hiroki Kurata, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 7, 2022
Integrated Differential Phase Contrast (IDPC)-STEM Utilizing a Multi-Sector Detector for Imaging Thick SamplesZhongbo Li, Johannes Biskupek, Ute Kaiser, et al.
Nano Letters|July 1, 2024
Defect Density and Atomic Defect Recognition in the Middle Layer of a Trilayer MoS<sub>2</sub> StackMoritz Quincke, Manuel Mundszinger, Johannes Biskupek, et al.
Pageof 8