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ACS Applied Materials & Interfaces
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August 27, 2015
Complex Internal Bias Fields in Ferroelectric Hafnium Oxide
Tony Schenk, Michael Hoffmann, Johannes Ocker, et al.
ACS Applied Materials & Interfaces
|
January 11, 2017
Switching Kinetics in Nanoscale Hafnium Oxide Based Ferroelectric Field-Effect Transistors
Halid Mulaosmanovic, Johannes Ocker, Stefan Müller, et al.
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Search research articles
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Showing results (1-10 of 2) with videos related to
Sort By:
Page
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ACS Applied Materials & Interfaces
|
August 27, 2015
Complex Internal Bias Fields in Ferroelectric Hafnium Oxide
Tony Schenk, Michael Hoffmann, Johannes Ocker, et al.
ACS Applied Materials & Interfaces
|
January 11, 2017
Switching Kinetics in Nanoscale Hafnium Oxide Based Ferroelectric Field-Effect Transistors
Halid Mulaosmanovic, Johannes Ocker, Stefan Müller, et al.
Page
of 1