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Ultramicroscopy|July 28, 2005
Determination of the Fe content of embedded Cu-rich particles in ferritic alloys using energy-filtered TEMSergio Lozano-Perez, John M Titchmarsh, Michael L Jenkins
Ultramicroscopy|March 22, 2005
A versatile double aberration-corrected, energy filtered HREM/STEM for materials scienceJohn L Hutchison, John M Titchmarsh, David J H Cockayne, et al.
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