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John Mardinly

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 21, 2003
HRTEM image simulations for the study of ultrathin gate oxidesSeth T Taylor, John Mardinly, Michael A O'Keefe
Microscopy (Oxford, England)|March 29, 2013
Exploring aberration-corrected electron microscopy for compound semiconductorsDavid J Smith, Toshihiro Aoki, John Mardinly, et al.
Physical Chemistry Chemical Physics : PCCP|June 11, 2016
Irradiation-induced grain growth and defect evolution in nanocrystalline zirconia with doped grain boundariesSanchita Dey, John Mardinly, Yongqiang Wang, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 21, 2003
HRTEM image simulations for the study of ultrathin gate oxidesSeth T Taylor, John Mardinly, Michael A O'Keefe
Microscopy (Oxford, England)|March 29, 2013
Exploring aberration-corrected electron microscopy for compound semiconductorsDavid J Smith, Toshihiro Aoki, John Mardinly, et al.
Physical Chemistry Chemical Physics : PCCP|June 11, 2016
Irradiation-induced grain growth and defect evolution in nanocrystalline zirconia with doped grain boundariesSanchita Dey, John Mardinly, Yongqiang Wang, et al.
Pageof 1