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John N Randall

Showing results (1-10 of 5) with videos related to

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The Review of Scientific Instruments|February 3, 2018
On the effect of local barrier height in scanning tunneling microscopy: Measurement methods and control implicationsFarid Tajaddodianfar, S O Reza Moheimani, James Owen, et al.
Nanotechnology|February 19, 2013
A density-functional theory study of tip electronic structures in scanning tunneling microscopyHeesung Choi, Roberto C Longo, Min Huang, et al.
The Review of Scientific Instruments|March 27, 2024
Atom-resolved imaging with a silicon tip integrated into an on-chip scanning tunneling microscopeAfshin Alipour, Emma L Fowler, S O Reza Moheimani, et al.
Nano Letters|June 30, 2021
Advanced Scanning Probe Nanolithography Using GaN NanowiresMahmoud Behzadirad, Stephan Mecholdt, John N Randall, et al.
Journal of Visualized Experiments : Jove|August 15, 2015
Atomically Traceable Nanostructure FabricationJosh B Ballard, Don D Dick, Stephen J McDonnell, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
The Review of Scientific Instruments|February 3, 2018
On the effect of local barrier height in scanning tunneling microscopy: Measurement methods and control implicationsFarid Tajaddodianfar, S O Reza Moheimani, James Owen, et al.
Nanotechnology|February 19, 2013
A density-functional theory study of tip electronic structures in scanning tunneling microscopyHeesung Choi, Roberto C Longo, Min Huang, et al.
The Review of Scientific Instruments|March 27, 2024
Atom-resolved imaging with a silicon tip integrated into an on-chip scanning tunneling microscopeAfshin Alipour, Emma L Fowler, S O Reza Moheimani, et al.
Nano Letters|June 30, 2021
Advanced Scanning Probe Nanolithography Using GaN NanowiresMahmoud Behzadirad, Stephan Mecholdt, John N Randall, et al.
Journal of Visualized Experiments : Jove|August 15, 2015
Atomically Traceable Nanostructure FabricationJosh B Ballard, Don D Dick, Stephen J McDonnell, et al.
Pageof 1