Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

John S Villarrubia

Showing results (1-10 of 8) with videos related to

Pageof 1
Sort By:
Journal of Scientific Computing|March 14, 2020
An a posteriori Error Estimate for Scanning Electron Microscope Simulation with Adaptive Mesh RefinementWilliam F Mitchell, John S Villarrubia
Ultramicroscopy|August 18, 2019
Conventional vs. model-based measurement of patterned line widths from scanning electron microscopy profilesFrancesc Salvat-Pujol, John S Villarrubia
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 19, 2017
Three-Dimensional (3D) Nanometrology Based on Scanning Electron Microscope (SEM) StereophotogrammetryVipin N Tondare, John S Villarrubia, András E Vladár
ACS Omega|March 10, 2020
Electron Inelastic Mean Free Paths for LiF, CaF<sub>2</sub>, Al<sub>2</sub>O<sub>3</sub>, and Liquid Water from 433 keV down to the Energy GapMiguel Angel Flores-Mancera, John S Villarrubia, Guerda Massillon-Jl
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 26, 2016
Comparison of Electron Imaging Modes for Dimensional Measurements in the Scanning Electron MicroscopeMichael T Postek, András E Vladár, John S Villarrubia, et al.
ACS Applied Materials & Interfaces|December 17, 2020
Probing Electrified Liquid-Solid Interfaces with Scanning Electron MicroscopyHongxuan Guo, Alexander Yulaev, Evgheni Strelcov, et al.
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3|December 19, 2015
Optimizing Hybrid Metrology: Rigorous Implementation of Bayesian and Combined RegressionMark-Alexander Henn, Richard M Silver, John S Villarrubia, et al.
Advanced Functional Materials|February 24, 2023
Unmasking the Resolution-Throughput Tradespace of Focused-Ion-Beam MachiningAndrew C Madison, John S Villarrubia, Kuo-Tang Liao, et al.
Pageof 1

Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
Journal of Scientific Computing|March 14, 2020
An a posteriori Error Estimate for Scanning Electron Microscope Simulation with Adaptive Mesh RefinementWilliam F Mitchell, John S Villarrubia
Ultramicroscopy|August 18, 2019
Conventional vs. model-based measurement of patterned line widths from scanning electron microscopy profilesFrancesc Salvat-Pujol, John S Villarrubia
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 19, 2017
Three-Dimensional (3D) Nanometrology Based on Scanning Electron Microscope (SEM) StereophotogrammetryVipin N Tondare, John S Villarrubia, András E Vladár
ACS Omega|March 10, 2020
Electron Inelastic Mean Free Paths for LiF, CaF<sub>2</sub>, Al<sub>2</sub>O<sub>3</sub>, and Liquid Water from 433 keV down to the Energy GapMiguel Angel Flores-Mancera, John S Villarrubia, Guerda Massillon-Jl
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 26, 2016
Comparison of Electron Imaging Modes for Dimensional Measurements in the Scanning Electron MicroscopeMichael T Postek, András E Vladár, John S Villarrubia, et al.
ACS Applied Materials & Interfaces|December 17, 2020
Probing Electrified Liquid-Solid Interfaces with Scanning Electron MicroscopyHongxuan Guo, Alexander Yulaev, Evgheni Strelcov, et al.
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3|December 19, 2015
Optimizing Hybrid Metrology: Rigorous Implementation of Bayesian and Combined RegressionMark-Alexander Henn, Richard M Silver, John S Villarrubia, et al.
Advanced Functional Materials|February 24, 2023
Unmasking the Resolution-Throughput Tradespace of Focused-Ion-Beam MachiningAndrew C Madison, John S Villarrubia, Kuo-Tang Liao, et al.
Pageof 1