Three-Dimensional Microscopy in Microbiology
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Scanning Electron Microscopy
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Updated: Feb 22, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
Vipin N Tondare1,2, John S Villarrubia1, András E Vladár1
1Engineering Physics Division, Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), 100 Bureau Drive, Stop 8212, Gaithersburg, MD 20899, USA.
Stereophotogrammetry software packages for 3D surface reconstruction from scanning electron microscope (SEM) images show high error in uniform zones. Further improvements are needed for reliable 3D modeling of low-contrast SEM samples.
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