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Joke Hadermann

Showing results (1-10 of 103) with videos related to

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Acta Crystallographica. Section A, Foundations of Crystallography|December 23, 2004
Transmission electron microscopy and structural phase transitions in anion-deficient perovskite-based oxidesJoke Hadermann
Ultramicroscopy|August 10, 2024
Optimization of three-dimensional electron diffuse scattering data acquisitionRomy Poppe, Joke Hadermann
Acta Crystallographica Section B, Structural Science, Crystal Engineering and Materials|August 25, 2020
Introduction to the special issue on electron crystallographyJoke Hadermann, Lukáš Palatinus
Ultramicroscopy|August 18, 2024
The effect of the acceleration voltage on the quality of structure determination by 3D-electron diffractionSaleh Gholam, Joke Hadermann
Hardwarex|July 7, 2025
MDT: A simple tool to facilitate dropcasting on <i>in situ</i> TEM MEMS chipsMatthias Quintelier, Joke Hadermann
Acta Crystallographica Section B, Structural Science, Crystal Engineering and Materials|August 25, 2020
Structure solution and refinement of metal-ion battery cathode materials using electron diffraction tomographyJoke Hadermann, Artem M Abakumov
Acta Crystallographica Section B, Structural Science, Crystal Engineering and Materials|August 25, 2020
Interstitial defects in the van der Waals gap of Bi<sub>2</sub>Se<sub>3</sub>Carolien Callaert, Marnik Bercx, Dirk Lamoen, et al.
Iucrj|September 8, 2022
Quantitative analysis of diffuse electron scattering in the lithium-ion battery cathode material Li<sub>1.2</sub>Ni<sub>0.13</sub>Mn<sub>0.54</sub>Co<sub>0.13</sub>O<sub>2</sub>Romy Poppe, Daphne Vandemeulebroucke, Reinhard B Neder, et al.
Journal of the American Chemical Society|August 21, 2007
Topotactic oxidative and reductive control of the structures and properties of layered manganese oxychalcogenidesGeoffrey Hyett, Nicolas Barrier, Simon J Clarke, et al.
Acta Crystallographica Section B, Structural Science, Crystal Engineering and Materials|April 2, 2015
Synergy between transmission electron microscopy and powder diffraction: application to modulated structuresDmitry Batuk, Maria Batuk, Artem M Abakumov, et al.
Pageof 11

Showing results (1-10 of 103) with videos related to

Sort By:
Pageof 11
Acta Crystallographica. Section A, Foundations of Crystallography|December 23, 2004
Transmission electron microscopy and structural phase transitions in anion-deficient perovskite-based oxidesJoke Hadermann
Ultramicroscopy|August 10, 2024
Optimization of three-dimensional electron diffuse scattering data acquisitionRomy Poppe, Joke Hadermann
Acta Crystallographica Section B, Structural Science, Crystal Engineering and Materials|August 25, 2020
Introduction to the special issue on electron crystallographyJoke Hadermann, Lukáš Palatinus
Ultramicroscopy|August 18, 2024
The effect of the acceleration voltage on the quality of structure determination by 3D-electron diffractionSaleh Gholam, Joke Hadermann
Hardwarex|July 7, 2025
MDT: A simple tool to facilitate dropcasting on <i>in situ</i> TEM MEMS chipsMatthias Quintelier, Joke Hadermann
Acta Crystallographica Section B, Structural Science, Crystal Engineering and Materials|August 25, 2020
Structure solution and refinement of metal-ion battery cathode materials using electron diffraction tomographyJoke Hadermann, Artem M Abakumov
Acta Crystallographica Section B, Structural Science, Crystal Engineering and Materials|August 25, 2020
Interstitial defects in the van der Waals gap of Bi<sub>2</sub>Se<sub>3</sub>Carolien Callaert, Marnik Bercx, Dirk Lamoen, et al.
Iucrj|September 8, 2022
Quantitative analysis of diffuse electron scattering in the lithium-ion battery cathode material Li<sub>1.2</sub>Ni<sub>0.13</sub>Mn<sub>0.54</sub>Co<sub>0.13</sub>O<sub>2</sub>Romy Poppe, Daphne Vandemeulebroucke, Reinhard B Neder, et al.
Journal of the American Chemical Society|August 21, 2007
Topotactic oxidative and reductive control of the structures and properties of layered manganese oxychalcogenidesGeoffrey Hyett, Nicolas Barrier, Simon J Clarke, et al.
Acta Crystallographica Section B, Structural Science, Crystal Engineering and Materials|April 2, 2015
Synergy between transmission electron microscopy and powder diffraction: application to modulated structuresDmitry Batuk, Maria Batuk, Artem M Abakumov, et al.
Pageof 11