Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Jolien Dendooven

Showing results (31-40 of 58) with videos related to

Pageof 6
Sort By:
ACS Nano|July 8, 2016
Chemically Triggered Formation of Two-Dimensional Epitaxial Quantum Dot SuperlatticesWillem Walravens, Jonathan De Roo, Emile Drijvers, et al.
Physical Chemistry Chemical Physics : PCCP|April 21, 2020
Study of the surface species during thermal and plasma-enhanced atomic layer deposition of titanium oxide films using in situ IR-spectroscopy and in vacuo X-ray photoelectron spectroscopySofie S T Vandenbroucke, Elisabeth Levrau, Matthias M Minjauw, et al.
ACS Applied Materials & Interfaces|May 20, 2022
Titanium Carboxylate Molecular Layer Deposited Hybrid Films as Protective Coatings for Lithium-Ion BatteriesSofie S T Vandenbroucke, Lowie Henderick, Louis L De Taeye, et al.
Nanoscale|August 30, 2017
Key role of surface oxidation and reduction processes in the coarsening of Pt nanoparticlesEduardo Solano, Jolien Dendooven, Matthias M Minjauw, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|February 7, 2012
In situ monitoring of atomic layer deposition in nanoporous thin films using ellipsometric porosimetryJolien Dendooven, Kilian Devloo-Casier, Elisabeth Levrau, et al.
Nanoscale|November 17, 2017
Correction: Key role of surface oxidation and reduction processes in the coarsening of Pt nanoparticlesEduardo Solano, Jolien Dendooven, Matthias M Minjauw, et al.
The Review of Scientific Instruments|December 3, 2016
Mobile setup for synchrotron based in situ characterization during thermal and plasma-enhanced atomic layer depositionJolien Dendooven, Eduardo Solano, Matthias M Minjauw, et al.
Scientific Reports|March 21, 2017
On the determination of χ<sup>(2)</sup> in thin films: a comparison of one-beam second-harmonic generation measurement methodologiesArtur Hermans, Clemens Kieninger, Kalle Koskinen, et al.
Nanoscale|November 4, 2014
Atomic layer deposition-based tuning of the pore size in mesoporous thin films studied by in situ grazing incidence small angle X-ray scatteringJolien Dendooven, Kilian Devloo-Casier, Matthias Ide, et al.
Faraday Discussions|May 11, 2022
Aligning time-resolved kinetics (TAP) and surface spectroscopy (AP-XPS) for a more comprehensive understanding of ALD-derived 2D and 3D model catalystsEvgeniy A Redekop, Hilde Poelman, Matthias Filez, et al.
Pageof 6

Showing results (31-40 of 58) with videos related to

Sort By:
Pageof 6
ACS Nano|July 8, 2016
Chemically Triggered Formation of Two-Dimensional Epitaxial Quantum Dot SuperlatticesWillem Walravens, Jonathan De Roo, Emile Drijvers, et al.
Physical Chemistry Chemical Physics : PCCP|April 21, 2020
Study of the surface species during thermal and plasma-enhanced atomic layer deposition of titanium oxide films using in situ IR-spectroscopy and in vacuo X-ray photoelectron spectroscopySofie S T Vandenbroucke, Elisabeth Levrau, Matthias M Minjauw, et al.
ACS Applied Materials & Interfaces|May 20, 2022
Titanium Carboxylate Molecular Layer Deposited Hybrid Films as Protective Coatings for Lithium-Ion BatteriesSofie S T Vandenbroucke, Lowie Henderick, Louis L De Taeye, et al.
Nanoscale|August 30, 2017
Key role of surface oxidation and reduction processes in the coarsening of Pt nanoparticlesEduardo Solano, Jolien Dendooven, Matthias M Minjauw, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|February 7, 2012
In situ monitoring of atomic layer deposition in nanoporous thin films using ellipsometric porosimetryJolien Dendooven, Kilian Devloo-Casier, Elisabeth Levrau, et al.
Nanoscale|November 17, 2017
Correction: Key role of surface oxidation and reduction processes in the coarsening of Pt nanoparticlesEduardo Solano, Jolien Dendooven, Matthias M Minjauw, et al.
The Review of Scientific Instruments|December 3, 2016
Mobile setup for synchrotron based in situ characterization during thermal and plasma-enhanced atomic layer depositionJolien Dendooven, Eduardo Solano, Matthias M Minjauw, et al.
Scientific Reports|March 21, 2017
On the determination of χ<sup>(2)</sup> in thin films: a comparison of one-beam second-harmonic generation measurement methodologiesArtur Hermans, Clemens Kieninger, Kalle Koskinen, et al.
Nanoscale|November 4, 2014
Atomic layer deposition-based tuning of the pore size in mesoporous thin films studied by in situ grazing incidence small angle X-ray scatteringJolien Dendooven, Kilian Devloo-Casier, Matthias Ide, et al.
Faraday Discussions|May 11, 2022
Aligning time-resolved kinetics (TAP) and surface spectroscopy (AP-XPS) for a more comprehensive understanding of ALD-derived 2D and 3D model catalystsEvgeniy A Redekop, Hilde Poelman, Matthias Filez, et al.
Pageof 6