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Jonathan Houard

Showing results (1-10 of 16) with videos related to

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Sensors (Basel, Switzerland)|July 13, 2024
THz Generation by Two-Color Plasma: Time Shaping and Ultra-Broadband PolarimetryDomenico Paparo, Anna Martinez, Andrea Rubano, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 11, 2017
Field-Dependent Measurement of GaAs Composition by Atom Probe TomographyEnrico Di Russo, Ivan Blum, Jonathan Houard, et al.
Journal of Microscopy|October 16, 2023
Field-dependent abundances of hydride molecular ions in atom probe tomography of III-N semiconductorsAissatou Diagne, Luis Gonzalez Garcia, Samba Ndiaye, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 9, 2017
Optimizing Atom Probe Analysis with Synchronous Laser Pulsing and Voltage PulsingLu Zhao, Antoine Normand, Jonathan Houard, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 20, 2021
Development of an Energy-Sensitive Detector for the Atom Probe TomographyChristian Bacchi, Gérald Da Costa, Emmanuel Cadel, et al.
Nano Letters|May 14, 2025
A Photonic Atom Probe Study of Thermal Effects at the Nanosecond and Nanometer scaleSubodh K Gautam, Samba Ndiaye, Jonathan Houard, et al.
Science Advances|February 11, 2021
High-resolution terahertz-driven atom probe tomographyAngela Vella, Jonathan Houard, Laurent Arnoldi, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 25, 2023
The Photonic Atom Probe as a Tool for the Analysis of the Effect of Defects on the Luminescence of Nitride Quantum StructuresIoanna Dimkou, Jonathan Houard, Névine Rochat, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 15, 2026
Exploring Mechanisms Leading to Composition Errors in Monazite (CePO4) Analyzed With Atom Probe TomographyTom Veret, Fabien Delaroche, Ivan Blum, et al.
Nano Letters|June 28, 2017
Carrier Localization in GaN/AlN Quantum Dots As Revealed by Three-Dimensional MultimicroscopyLorenzo Mancini, Florian Moyon, David Hernàndez-Maldonado, et al.
Pageof 2

Showing results (1-10 of 16) with videos related to

Sort By:
Pageof 2
Sensors (Basel, Switzerland)|July 13, 2024
THz Generation by Two-Color Plasma: Time Shaping and Ultra-Broadband PolarimetryDomenico Paparo, Anna Martinez, Andrea Rubano, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 11, 2017
Field-Dependent Measurement of GaAs Composition by Atom Probe TomographyEnrico Di Russo, Ivan Blum, Jonathan Houard, et al.
Journal of Microscopy|October 16, 2023
Field-dependent abundances of hydride molecular ions in atom probe tomography of III-N semiconductorsAissatou Diagne, Luis Gonzalez Garcia, Samba Ndiaye, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 9, 2017
Optimizing Atom Probe Analysis with Synchronous Laser Pulsing and Voltage PulsingLu Zhao, Antoine Normand, Jonathan Houard, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 20, 2021
Development of an Energy-Sensitive Detector for the Atom Probe TomographyChristian Bacchi, Gérald Da Costa, Emmanuel Cadel, et al.
Nano Letters|May 14, 2025
A Photonic Atom Probe Study of Thermal Effects at the Nanosecond and Nanometer scaleSubodh K Gautam, Samba Ndiaye, Jonathan Houard, et al.
Science Advances|February 11, 2021
High-resolution terahertz-driven atom probe tomographyAngela Vella, Jonathan Houard, Laurent Arnoldi, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 25, 2023
The Photonic Atom Probe as a Tool for the Analysis of the Effect of Defects on the Luminescence of Nitride Quantum StructuresIoanna Dimkou, Jonathan Houard, Névine Rochat, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 15, 2026
Exploring Mechanisms Leading to Composition Errors in Monazite (CePO4) Analyzed With Atom Probe TomographyTom Veret, Fabien Delaroche, Ivan Blum, et al.
Nano Letters|June 28, 2017
Carrier Localization in GaN/AlN Quantum Dots As Revealed by Three-Dimensional MultimicroscopyLorenzo Mancini, Florian Moyon, David Hernàndez-Maldonado, et al.
Pageof 2