Jose F Portoles - JoVE Visualize

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Nanotechnology|July 30, 2013

A compact torsional reference device for easy, accurate and traceable AFM piconewton calibrationJose F Portoles, Peter J Cumpson

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 14, 2016

Removing Beam Current Artifacts in Helium Ion Microscopy: A Comparison of Image Processing TechniquesAnders J Barlow, Jose F Portoles, Naoko Sano, et al.

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Showing results (1-10 of 2) with videos related to

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Pageof 1

Nanotechnology|July 30, 2013

A compact torsional reference device for easy, accurate and traceable AFM piconewton calibrationJose F Portoles, Peter J Cumpson

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 14, 2016

Removing Beam Current Artifacts in Helium Ion Microscopy: A Comparison of Image Processing TechniquesAnders J Barlow, Jose F Portoles, Naoko Sano, et al.

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