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Joseph Kozole

Showing results (1-10 of 14) with videos related to

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Applied Surface Science|June 26, 2009
The effect of incident angle on the C(60) bombardment of molecular solidsJoseph Kozole, David Willingham, Nicholas Winograd
Analytical Chemistry|June 14, 2008
Energy deposition during molecular depth profiling experiments with cluster ion beamsJoseph Kozole, Andreas Wucher, Nicholas Winograd
Journal of the American Society for Mass Spectrometry|November 23, 2006
Direct comparison of Au(3)(+) and C(60)(+) cluster projectiles in SIMS molecular depth profilingJuan Cheng, Joseph Kozole, Robert Hengstebeck, et al.
Talanta|June 7, 2015
Gas phase ion chemistry of an ion mobility spectrometry based explosive trace detector elucidated by tandem mass spectrometryJoseph Kozole, Lauren A Levine, Jill Tomlinson-Phillips, et al.
Physical Review Letters|June 29, 2006
Surface sensitivity in cluster-ion-induced sputteringChristopher Szakal, Joseph Kozole, Michael F Russo, et al.
Analytical Chemistry|May 17, 2007
Sputtering yields for C60 and Au3 bombardment of water ice as a function of incident kinetic energyMichael F Russo, Christopher Szakal, Joseph Kozole, et al.
Talanta|June 11, 2014
Characterization of TATP gas phase product ion chemistry via isotope labeling experiments using ion mobility spectrometry interfaced with a triple quadrupole mass spectrometerJill Tomlinson-Phillips, Alfred Wooten, Joseph Kozole, et al.
Analytical Chemistry|October 11, 2008
C60 secondary ion mass spectrometry with a hybrid-quadrupole orthogonal time-of-flight mass spectrometerAnthony Carado, M K Passarelli, Joseph Kozole, et al.
Applied Surface Science|February 28, 2009
Relative Quantification of Cellular Sections with Molecular Depth Profiling ToF-SIMS ImagingM E Kurczy, Joseph Kozole, S A Parry, et al.
Analytical Chemistry|October 1, 2005
Secondary ion MS imaging of lipids in picoliter vials with a buckminsterfullerene ion sourceSara G Ostrowski, Christopher Szakal, Joseph Kozole, et al.
Pageof 2

Showing results (1-10 of 14) with videos related to

Sort By:
Pageof 2
Applied Surface Science|June 26, 2009
The effect of incident angle on the C(60) bombardment of molecular solidsJoseph Kozole, David Willingham, Nicholas Winograd
Analytical Chemistry|June 14, 2008
Energy deposition during molecular depth profiling experiments with cluster ion beamsJoseph Kozole, Andreas Wucher, Nicholas Winograd
Journal of the American Society for Mass Spectrometry|November 23, 2006
Direct comparison of Au(3)(+) and C(60)(+) cluster projectiles in SIMS molecular depth profilingJuan Cheng, Joseph Kozole, Robert Hengstebeck, et al.
Talanta|June 7, 2015
Gas phase ion chemistry of an ion mobility spectrometry based explosive trace detector elucidated by tandem mass spectrometryJoseph Kozole, Lauren A Levine, Jill Tomlinson-Phillips, et al.
Physical Review Letters|June 29, 2006
Surface sensitivity in cluster-ion-induced sputteringChristopher Szakal, Joseph Kozole, Michael F Russo, et al.
Analytical Chemistry|May 17, 2007
Sputtering yields for C60 and Au3 bombardment of water ice as a function of incident kinetic energyMichael F Russo, Christopher Szakal, Joseph Kozole, et al.
Talanta|June 11, 2014
Characterization of TATP gas phase product ion chemistry via isotope labeling experiments using ion mobility spectrometry interfaced with a triple quadrupole mass spectrometerJill Tomlinson-Phillips, Alfred Wooten, Joseph Kozole, et al.
Analytical Chemistry|October 11, 2008
C60 secondary ion mass spectrometry with a hybrid-quadrupole orthogonal time-of-flight mass spectrometerAnthony Carado, M K Passarelli, Joseph Kozole, et al.
Applied Surface Science|February 28, 2009
Relative Quantification of Cellular Sections with Molecular Depth Profiling ToF-SIMS ImagingM E Kurczy, Joseph Kozole, S A Parry, et al.
Analytical Chemistry|October 1, 2005
Secondary ion MS imaging of lipids in picoliter vials with a buckminsterfullerene ion sourceSara G Ostrowski, Christopher Szakal, Joseph Kozole, et al.
Pageof 2