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Analytical Chemistry|June 14, 2008
Energy deposition during molecular depth profiling experiments with cluster ion beamsJoseph Kozole, Andreas Wucher, Nicholas WinogradAnalytical and Bioanalytical Chemistry|August 4, 2009
Molecular sputter depth profiling using carbon cluster beamsAndreas Wucher, Nicholas WinogradApplied Surface Science|June 26, 2009
The effect of incident angle on the C(60) bombardment of molecular solidsJoseph Kozole, David Willingham, Nicholas WinogradAnalytical Chemistry|June 23, 2007
Protocols for three-dimensional molecular imaging using mass spectrometryAndreas Wucher, Juan Cheng, Nicholas WinogradThe Journal of Physical Chemistry. C, Nanomaterials and Interfaces|October 27, 2009
Molecular Depth Profiling using a C(60) Cluster Beam: the Role of Impact EnergyAndreas Wucher, Juan Cheng, Nicholas WinogradAnalytical Chemistry|September 10, 2008
Depth resolution during C60+ profiling of multilayer molecular filmsLeiliang Zheng, Andreas Wucher, Nicholas WinogradAnalytical Chemistry|December 3, 2010
Molecular depth profiling of buried lipid bilayers using C(60)-secondary ion mass spectrometryCaiyan Lu, Andreas Wucher, Nicholas WinogradThe Journal of Physical Chemistry. B|April 21, 2006
Molecular depth profiling with cluster ion beamsJuan Cheng, Andreas Wucher, Nicholas WinogradJournal of the American Society for Mass Spectrometry|February 23, 2008
Chemically alternating Langmuir-Blodgett thin films as a model for molecular depth profiling by mass spectrometryLeiliang Zheng, Andreas Wucher, Nicholas WinogradRapid Communications in Mass Spectrometry : RCM|January 8, 2014
A mixed cluster ion beam to enhance the ionization efficiency in molecular secondary ion mass spectrometryAndreas Wucher, Hua Tian, Nicholas WinogradPageof 12