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Microscopy (Oxford, England)|July 18, 2015
Effect of Ti diffusion on the microstructure of Ge2Sb2Te5 in phase-change memory cellJucheol Park, JunSoo BaeMicron (Oxford, England : 1993)|November 28, 2008
Determination of complex dielectric functions at HfO(2)/Si interface by using STEM-VEELSJucheol Park, Mino YangPhysical Chemistry Chemical Physics : PCCP|April 24, 2018
Tunable polaron-induced coloration of tungsten oxide via a multi-step control of the physicochemical property for the detection of gaseous FSang Yeon Lee, Gowoon Shim, Jucheol Park, et al.Scientific Reports|September 2, 2017
Forming-less and Non-Volatile Resistive Switching in WOX by Oxygen Vacancy Control at InterfacesSeokjae Won, Sang Yeon Lee, Jucheol Park, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 8, 2013
Electron energy loss spectroscopy characterization of TANOS (TaN/Al₂O₃/Si₃N₄/SiO₂/Si) stacksJucheol Park, Sung Heo, JaeGwan Chung, et al.Nanoscale Research Letters|July 22, 2016
Formation of Pt-Zn Alloy Nanoparticles by Electron-Beam Irradiation of Wurtzite ZnO in the TEMSung Bo Lee, Jucheol Park, Peter A van AkenACS Nano|May 19, 2017
Creation of a Short-Range Ordered Two-Dimensional Electron Gas Channel in Al2O3/In2O3 InterfacesSang Yeon Lee, Jinseo Kim, Ayoung Park, et al.Nanoscale|November 26, 2016
In situ TEM observation on the interface-type resistive switching by electrochemical redox reactions at a TiN/PCMO interfaceKyungjoon Baek, Sangsu Park, Jucheol Park, et al.Applied Microscopy|February 13, 2021
Introduction to the standard reference data of electron energy loss spectra and their database: eel.geri.re.krJeong Eun Chae, Ji-Soo Kim, Sang-Yeol Nam, et al.Applied Microscopy|June 16, 2026
Structural and electrical characterization of Hf0.5Zr0.5O2 thin films crystallized by rapid thermal annealingJucheol Park, Yeong Gyeong Park, Min-Ho Kang, et al.Pageof 4