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Julian Henn

Showing results (1-10 of 31) with videos related to

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Journal of Applied Crystallography|February 7, 2025
Bias caused by a popular weighting schemeJulian Henn
Journal of Applied Crystallography|August 6, 2025
Two metrics for quantifying systematic errors in diffraction experiments: systematic errors in the variance of the observed intensities and agreement factor gapJulian Henn
Acta Crystallographica. Section A, Foundations and Advances|November 4, 2016
An alternative to the goodness of fitJulian Henn
Acta Crystallographica. Section A, Foundations of Crystallography|October 19, 2012
Expectation values for integer powers of a Poisson-distributed random numberJulian Henn
Acta Crystallographica. Section A, Foundations of Crystallography|October 18, 2013
More about residual valuesJulian Henn, Andreas Schönleber
Acta Crystallographica. Section A, Foundations and Advances|May 13, 2014
About systematic errors in charge-density studiesJulian Henn, Kathrin Meindl
Acta Crystallographica. Section A, Foundations of Crystallography|October 22, 2010
Is there a fundamental upper limit for the significance I/σ(I) of observations from X-ray and neutron diffraction experiments?Julian Henn, Kathrin Meindl
Acta Crystallographica. Section A, Foundations and Advances|September 2, 2014
More about systematic errors in charge-density studiesJulian Henn, Kathrin Meindl
Acta Crystallographica. Section A, Foundations and Advances|March 3, 2015
Statistical tests against systematic errors in data sets based on the equality of residual means and variances from control samples: theory and applicationsJulian Henn, Kathrin Meindl
Acta Crystallographica. Section A, Foundations of Crystallography|April 19, 2008
Foundations of residual-density analysisKathrin Meindl, Julian Henn
Pageof 4

Showing results (1-10 of 31) with videos related to

Sort By:
Pageof 4
Journal of Applied Crystallography|February 7, 2025
Bias caused by a popular weighting schemeJulian Henn
Journal of Applied Crystallography|August 6, 2025
Two metrics for quantifying systematic errors in diffraction experiments: systematic errors in the variance of the observed intensities and agreement factor gapJulian Henn
Acta Crystallographica. Section A, Foundations and Advances|November 4, 2016
An alternative to the goodness of fitJulian Henn
Acta Crystallographica. Section A, Foundations of Crystallography|October 19, 2012
Expectation values for integer powers of a Poisson-distributed random numberJulian Henn
Acta Crystallographica. Section A, Foundations of Crystallography|October 18, 2013
More about residual valuesJulian Henn, Andreas Schönleber
Acta Crystallographica. Section A, Foundations and Advances|May 13, 2014
About systematic errors in charge-density studiesJulian Henn, Kathrin Meindl
Acta Crystallographica. Section A, Foundations of Crystallography|October 22, 2010
Is there a fundamental upper limit for the significance I/σ(I) of observations from X-ray and neutron diffraction experiments?Julian Henn, Kathrin Meindl
Acta Crystallographica. Section A, Foundations and Advances|September 2, 2014
More about systematic errors in charge-density studiesJulian Henn, Kathrin Meindl
Acta Crystallographica. Section A, Foundations and Advances|March 3, 2015
Statistical tests against systematic errors in data sets based on the equality of residual means and variances from control samples: theory and applicationsJulian Henn, Kathrin Meindl
Acta Crystallographica. Section A, Foundations of Crystallography|April 19, 2008
Foundations of residual-density analysisKathrin Meindl, Julian Henn
Pageof 4