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Journal of Applied Crystallography
|
February 7, 2025
Bias caused by a popular weighting scheme
Julian Henn
Journal of Applied Crystallography
|
August 6, 2025
Two metrics for quantifying systematic errors in diffraction experiments: systematic errors in the variance of the observed intensities and agreement factor gap
Julian Henn
Acta Crystallographica. Section A, Foundations and Advances
|
November 4, 2016
An alternative to the goodness of fit
Julian Henn
Acta Crystallographica. Section A, Foundations of Crystallography
|
October 19, 2012
Expectation values for integer powers of a Poisson-distributed random number
Julian Henn
Acta Crystallographica. Section A, Foundations of Crystallography
|
October 18, 2013
More about residual values
Julian Henn, Andreas Schönleber
Acta Crystallographica. Section A, Foundations and Advances
|
May 13, 2014
About systematic errors in charge-density studies
Julian Henn, Kathrin Meindl
Acta Crystallographica. Section A, Foundations of Crystallography
|
October 22, 2010
Is there a fundamental upper limit for the significance I/σ(I) of observations from X-ray and neutron diffraction experiments?
Julian Henn, Kathrin Meindl
Acta Crystallographica. Section A, Foundations and Advances
|
September 2, 2014
More about systematic errors in charge-density studies
Julian Henn, Kathrin Meindl
Acta Crystallographica. Section A, Foundations and Advances
|
March 3, 2015
Statistical tests against systematic errors in data sets based on the equality of residual means and variances from control samples: theory and applications
Julian Henn, Kathrin Meindl
Acta Crystallographica. Section A, Foundations of Crystallography
|
April 19, 2008
Foundations of residual-density analysis
Kathrin Meindl, Julian Henn
Page
of 4
Search research articles
Search
Showing results (1-10 of 31) with videos related to
Sort By:
Page
of 4
Journal of Applied Crystallography
|
February 7, 2025
Bias caused by a popular weighting scheme
Julian Henn
Journal of Applied Crystallography
|
August 6, 2025
Two metrics for quantifying systematic errors in diffraction experiments: systematic errors in the variance of the observed intensities and agreement factor gap
Julian Henn
Acta Crystallographica. Section A, Foundations and Advances
|
November 4, 2016
An alternative to the goodness of fit
Julian Henn
Acta Crystallographica. Section A, Foundations of Crystallography
|
October 19, 2012
Expectation values for integer powers of a Poisson-distributed random number
Julian Henn
Acta Crystallographica. Section A, Foundations of Crystallography
|
October 18, 2013
More about residual values
Julian Henn, Andreas Schönleber
Acta Crystallographica. Section A, Foundations and Advances
|
May 13, 2014
About systematic errors in charge-density studies
Julian Henn, Kathrin Meindl
Acta Crystallographica. Section A, Foundations of Crystallography
|
October 22, 2010
Is there a fundamental upper limit for the significance I/σ(I) of observations from X-ray and neutron diffraction experiments?
Julian Henn, Kathrin Meindl
Acta Crystallographica. Section A, Foundations and Advances
|
September 2, 2014
More about systematic errors in charge-density studies
Julian Henn, Kathrin Meindl
Acta Crystallographica. Section A, Foundations and Advances
|
March 3, 2015
Statistical tests against systematic errors in data sets based on the equality of residual means and variances from control samples: theory and applications
Julian Henn, Kathrin Meindl
Acta Crystallographica. Section A, Foundations of Crystallography
|
April 19, 2008
Foundations of residual-density analysis
Kathrin Meindl, Julian Henn
Page
of 4