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Julien Guyon

Showing results (1-10 of 6) with videos related to

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Materials (Basel, Switzerland)|February 21, 2018
A Dislocation-Scale Characterization of the Evolution of Deformation Microstructures around Nanoindentation Imprints in a TiAl AlloyAntoine Guitton, Hana Kriaa, Emmanuel Bouzy, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 13, 2025
Estimation of Dislocation Densities With Nondestructive Scanning Electron Microscope Techniques: Application to Gallium NitrideArka Mandal, Benoît Beausir, Julien Guyon, et al.
Ultramicroscopy|December 22, 2015
Advancing FIB assisted 3D EBSD using a static sample setupJulien Guyon, Nathalie Gey, Daniel Goran, et al.
Ultramicroscopy|June 13, 2026
A single multi-configuration direct electron detector for various electron imaging and diffraction-based techniques in SEMNohayla El-Khairaoui, Julien Guyon, Nathalie Gey, et al.
Materials (Basel, Switzerland)|November 11, 2022
Secondary Hardening of a High-N Ni-Free Stainless SteelNathalie Siredey-Schwaller, Pierre Charbonnier, Yudong Zhang, et al.
Materials (Basel, Switzerland)|August 7, 2019
In Situ Macroscopic Tensile Testing in SEM and Electron Channeling Contrast Imaging: Pencil Glide Evidenced in a Bulk β-Ti21S PolycrystalMeriem Ben Haj Slama, Nabila Maloufi, Julien Guyon, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Materials (Basel, Switzerland)|February 21, 2018
A Dislocation-Scale Characterization of the Evolution of Deformation Microstructures around Nanoindentation Imprints in a TiAl AlloyAntoine Guitton, Hana Kriaa, Emmanuel Bouzy, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 13, 2025
Estimation of Dislocation Densities With Nondestructive Scanning Electron Microscope Techniques: Application to Gallium NitrideArka Mandal, Benoît Beausir, Julien Guyon, et al.
Ultramicroscopy|December 22, 2015
Advancing FIB assisted 3D EBSD using a static sample setupJulien Guyon, Nathalie Gey, Daniel Goran, et al.
Ultramicroscopy|June 13, 2026
A single multi-configuration direct electron detector for various electron imaging and diffraction-based techniques in SEMNohayla El-Khairaoui, Julien Guyon, Nathalie Gey, et al.
Materials (Basel, Switzerland)|November 11, 2022
Secondary Hardening of a High-N Ni-Free Stainless SteelNathalie Siredey-Schwaller, Pierre Charbonnier, Yudong Zhang, et al.
Materials (Basel, Switzerland)|August 7, 2019
In Situ Macroscopic Tensile Testing in SEM and Electron Channeling Contrast Imaging: Pencil Glide Evidenced in a Bulk β-Ti21S PolycrystalMeriem Ben Haj Slama, Nabila Maloufi, Julien Guyon, et al.
Pageof 1