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Jungjae Park

Showing results (1-10 of 42) with videos related to

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Optics Letters|July 29, 2010
Vibration-desensitized interferometer by continuous phase shifting with high-speed fringe capturingJungjae Park, Seung-Woo Kim
Optics Express|September 13, 2019
Simultaneous measurement method of the physical thickness and group refractive index free from a non-measurable rangeJungjae Park, Hiroki Mori, Jonghan Jin
Applied Optics|January 6, 2023
Linear-cavity Er-doped fiber mode-locked laser with large wavelength tunabilityYoon-Soo Jang, Jungjae Park, Jonghan Jin
Scientific Reports|March 3, 2023
Full C-band wavelength-tunable, 250 MHz repetition rate mode-locked polarization-maintaining fiber laserYoon-Soo Jang, Jungjae Park, Jonghan Jin
Optics Express|May 14, 2021
Sub-100-nm precision distance measurement by means of all-fiber photonic microwave mixingYoon-Soo Jang, Jungjae Park, Jonghan Jin
Scientific Reports|October 28, 2018
A Hybrid Non-destructive Measuring Method of Three-dimensional Profile of Through Silicon Vias for Realization of Smart DevicesHeulbi Ahn, Jaeseok Bae, Jungjae Park, et al.
Optics Express|June 21, 2012
Uncertainty improvement of geometrical thickness and refractive index measurement of a silicon wafer using a femtosecond pulse laserSaerom Maeng, Jungjae Park, Byungsung O, et al.
Optics Express|August 9, 2017
Total physical thickness measurement of a multi-layered wafer using a spectral-domain interferometer with an optical combJaeseok Bae, Jungjae Park, Heulbi Ahn, et al.
Optics Express|October 7, 2021
Optical method for simultaneous thickness measurements of two layers with a significant thickness differenceJaeseok Bae, Jungjae Park, Heulbi Ahn, et al.
Optics Express|October 6, 2012
Modified Roberts-Langenbeck test for measuring thickness and refractive index variation of silicon wafersJungjae Park, Lingfeng Chen, Quandou Wang, et al.
Pageof 5

Showing results (1-10 of 42) with videos related to

Sort By:
Pageof 5
Optics Letters|July 29, 2010
Vibration-desensitized interferometer by continuous phase shifting with high-speed fringe capturingJungjae Park, Seung-Woo Kim
Optics Express|September 13, 2019
Simultaneous measurement method of the physical thickness and group refractive index free from a non-measurable rangeJungjae Park, Hiroki Mori, Jonghan Jin
Applied Optics|January 6, 2023
Linear-cavity Er-doped fiber mode-locked laser with large wavelength tunabilityYoon-Soo Jang, Jungjae Park, Jonghan Jin
Scientific Reports|March 3, 2023
Full C-band wavelength-tunable, 250 MHz repetition rate mode-locked polarization-maintaining fiber laserYoon-Soo Jang, Jungjae Park, Jonghan Jin
Optics Express|May 14, 2021
Sub-100-nm precision distance measurement by means of all-fiber photonic microwave mixingYoon-Soo Jang, Jungjae Park, Jonghan Jin
Scientific Reports|October 28, 2018
A Hybrid Non-destructive Measuring Method of Three-dimensional Profile of Through Silicon Vias for Realization of Smart DevicesHeulbi Ahn, Jaeseok Bae, Jungjae Park, et al.
Optics Express|June 21, 2012
Uncertainty improvement of geometrical thickness and refractive index measurement of a silicon wafer using a femtosecond pulse laserSaerom Maeng, Jungjae Park, Byungsung O, et al.
Optics Express|August 9, 2017
Total physical thickness measurement of a multi-layered wafer using a spectral-domain interferometer with an optical combJaeseok Bae, Jungjae Park, Heulbi Ahn, et al.
Optics Express|October 7, 2021
Optical method for simultaneous thickness measurements of two layers with a significant thickness differenceJaeseok Bae, Jungjae Park, Heulbi Ahn, et al.
Optics Express|October 6, 2012
Modified Roberts-Langenbeck test for measuring thickness and refractive index variation of silicon wafersJungjae Park, Lingfeng Chen, Quandou Wang, et al.
Pageof 5