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Applied Optics
|
March 21, 2008
Phase-shifting point-diffraction interferometry at 193 nm
S H Lee, P Naulleau, K A Goldberg, et al.
Applied Optics
|
March 8, 2008
Extreme-ultraviolet phase-shifting point-diffraction interferometer: a wave-front metrology tool with subangstrom reference-wave accuracy
P P Naulleau, K A Goldberg, S H Lee, et al.
Applied Optics
|
March 22, 2008
Extreme-ultraviolet lensless Fourier-transform holography
S H Lee, P Naulleau, K A Goldberg, et al.
Optics Letters
|
February 3, 2009
Microscopy of extreme ultraviolet lithography masks with 13.2 nm tabletop laser illumination
F Brizuela, Y Wang, C A Brewer, et al.
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of 2
Search research articles
Search
Showing results (11-20 of 14) with videos related to
Sort By:
Page
of 2
You have reached the last page of results.
This site can display upto 14 results.
Applied Optics
|
March 21, 2008
Phase-shifting point-diffraction interferometry at 193 nm
S H Lee, P Naulleau, K A Goldberg, et al.
Applied Optics
|
March 8, 2008
Extreme-ultraviolet phase-shifting point-diffraction interferometer: a wave-front metrology tool with subangstrom reference-wave accuracy
P P Naulleau, K A Goldberg, S H Lee, et al.
Applied Optics
|
March 22, 2008
Extreme-ultraviolet lensless Fourier-transform holography
S H Lee, P Naulleau, K A Goldberg, et al.
Optics Letters
|
February 3, 2009
Microscopy of extreme ultraviolet lithography masks with 13.2 nm tabletop laser illumination
F Brizuela, Y Wang, C A Brewer, et al.
Page
of 2