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Journal of the Optical Society of America. A, Optics, Image Science, and Vision
|
December 4, 2012
Full polarization optical profilometry
S Arhab, H Giovannini, K Belkebir, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision
|
April 12, 2011
Full wave optical profilometry
S Arhab, G Soriano, K Belkebir, et al.
Optics Letters
|
June 3, 2010
Mirror-assisted tomographic diffractive microscopy with isotropic resolution
E Mudry, P C Chaumet, K Belkebir, et al.
Physical Review Letters
|
February 4, 2014
Full-polarized tomographic diffraction microscopy achieves a resolution about one-fourth of the wavelength
T Zhang, Y Ruan, G Maire, et al.
Physical Review Letters
|
August 20, 2013
Nanometric resolution with far-field optical profilometry
S Arhab, G Soriano, Y Ruan, et al.
Optics Letters
|
February 14, 2015
Tomographic diffractive microscopy with agile illuminations for imaging targets in a noisy background
T Zhang, C Godavarthi, P C Chaumet, et al.
Optics Letters
|
December 11, 2013
Structured illumination fluorescence microscopy with distorted excitations using a filtered blind-SIM algorithm
R Ayuk, H Giovannini, A Jost, et al.
Optics Letters
|
May 26, 2012
Tomographic diffractive microscopy with a wavefront sensor
Y Ruan, P Bon, E Mudry, et al.
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of 1
Search research articles
Search
Showing results (1-10 of 8) with videos related to
Sort By:
Page
of 1
Journal of the Optical Society of America. A, Optics, Image Science, and Vision
|
December 4, 2012
Full polarization optical profilometry
S Arhab, H Giovannini, K Belkebir, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision
|
April 12, 2011
Full wave optical profilometry
S Arhab, G Soriano, K Belkebir, et al.
Optics Letters
|
June 3, 2010
Mirror-assisted tomographic diffractive microscopy with isotropic resolution
E Mudry, P C Chaumet, K Belkebir, et al.
Physical Review Letters
|
February 4, 2014
Full-polarized tomographic diffraction microscopy achieves a resolution about one-fourth of the wavelength
T Zhang, Y Ruan, G Maire, et al.
Physical Review Letters
|
August 20, 2013
Nanometric resolution with far-field optical profilometry
S Arhab, G Soriano, Y Ruan, et al.
Optics Letters
|
February 14, 2015
Tomographic diffractive microscopy with agile illuminations for imaging targets in a noisy background
T Zhang, C Godavarthi, P C Chaumet, et al.
Optics Letters
|
December 11, 2013
Structured illumination fluorescence microscopy with distorted excitations using a filtered blind-SIM algorithm
R Ayuk, H Giovannini, A Jost, et al.
Optics Letters
|
May 26, 2012
Tomographic diffractive microscopy with a wavefront sensor
Y Ruan, P Bon, E Mudry, et al.
Page
of 1