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K H Guenther

Showing results (1-10 of 11) with videos related to

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Applied Optics|April 8, 2010
Nonoptical characterization of optical coatingsK H Guenther
Applied Optics|March 24, 2010
Nodular defects in dielectric multilayers and thick single layersK H Guenther
Applied Optics|March 24, 2010
Color variations of AR coatings caused by a leached layer on the substrateK H Guenther
Applied Optics|February 20, 2010
Electron microscopic investigations of cross sections of optical thin filmsK H Guenther, H K Pulker
Applied Optics|September 22, 2010
Emission spectroscopy of reactive low-voltage ion plating for metal-oxide thin filmsS Zarrabian, C Lee, K H Guenther
Applied Optics|September 22, 2010
Comparative study of titanium dioxide thin films produced by electron-beam evaporation and by reactive low-voltage ion platingK Balasubramanian, X F Han, K H Guenther
Applied Optics|September 22, 2010
Optical waveguide characterization of dielectric films deposited by reactive low-voltage ion platingT C Kimble, M D Himel, K H Guenther
Applied Optics|September 11, 2010
Correlation of light-scattering measurement and visual ranking of optical surfacesK H Guenther, J A McCandless, F D Orazio
Applied Optics|September 22, 2010
Absorption and thermal conductivity of oxide thin films measured by photothermal displacement and reflectance methodsZ L Wu, M Reichling, X Q Hu, et al.
Applied Optics|June 18, 2010
Comparison of the properties of titanium dioxide films prepared by various techniquesJ M Bennett, E Pelletier, G Albrand, et al.
Pageof 2

Showing results (1-10 of 11) with videos related to

Sort By:
Pageof 2
Applied Optics|April 8, 2010
Nonoptical characterization of optical coatingsK H Guenther
Applied Optics|March 24, 2010
Nodular defects in dielectric multilayers and thick single layersK H Guenther
Applied Optics|March 24, 2010
Color variations of AR coatings caused by a leached layer on the substrateK H Guenther
Applied Optics|February 20, 2010
Electron microscopic investigations of cross sections of optical thin filmsK H Guenther, H K Pulker
Applied Optics|September 22, 2010
Emission spectroscopy of reactive low-voltage ion plating for metal-oxide thin filmsS Zarrabian, C Lee, K H Guenther
Applied Optics|September 22, 2010
Comparative study of titanium dioxide thin films produced by electron-beam evaporation and by reactive low-voltage ion platingK Balasubramanian, X F Han, K H Guenther
Applied Optics|September 22, 2010
Optical waveguide characterization of dielectric films deposited by reactive low-voltage ion platingT C Kimble, M D Himel, K H Guenther
Applied Optics|September 11, 2010
Correlation of light-scattering measurement and visual ranking of optical surfacesK H Guenther, J A McCandless, F D Orazio
Applied Optics|September 22, 2010
Absorption and thermal conductivity of oxide thin films measured by photothermal displacement and reflectance methodsZ L Wu, M Reichling, X Q Hu, et al.
Applied Optics|June 18, 2010
Comparison of the properties of titanium dioxide films prepared by various techniquesJ M Bennett, E Pelletier, G Albrand, et al.
Pageof 2