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K J Ganesh

Showing results (1-10 of 6) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 1, 2010
D-stem: a parallel electron diffraction technique applied to nanomaterialsK J Ganesh, M Kawasaki, J P Zhou, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|September 9, 2010
Controlled assembly of silane-based polymers: chemically robust thin-filmsAruna Velamakanni, Jahn R Torres, K J Ganesh, et al.
Nanotechnology|March 16, 2012
Effect of downscaling nano-copper interconnects on the microstructure revealed by high resolution TEM-orientation-mappingK J Ganesh, A D Darbal, S Rajasekhara, et al.
ACS Nano|January 9, 2010
Site-specific deposition of Au nanoparticles in CNT films by chemical bondingAruna Velamakanni, Carl W Magnuson, K J Ganesh, et al.
Science (New York, N.Y.)|May 14, 2011
Carbon-based supercapacitors produced by activation of grapheneYanwu Zhu, Shanthi Murali, Meryl D Stoller, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 6, 2013
Grain boundary character distribution of nanocrystalline Cu thin films using stereological analysis of transmission electron microscope orientation mapsA D Darbal, K J Ganesh, X Liu, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 1, 2010
D-stem: a parallel electron diffraction technique applied to nanomaterialsK J Ganesh, M Kawasaki, J P Zhou, et al.
Langmuir : the ACS Journal of Surfaces and Colloids|September 9, 2010
Controlled assembly of silane-based polymers: chemically robust thin-filmsAruna Velamakanni, Jahn R Torres, K J Ganesh, et al.
Nanotechnology|March 16, 2012
Effect of downscaling nano-copper interconnects on the microstructure revealed by high resolution TEM-orientation-mappingK J Ganesh, A D Darbal, S Rajasekhara, et al.
ACS Nano|January 9, 2010
Site-specific deposition of Au nanoparticles in CNT films by chemical bondingAruna Velamakanni, Carl W Magnuson, K J Ganesh, et al.
Science (New York, N.Y.)|May 14, 2011
Carbon-based supercapacitors produced by activation of grapheneYanwu Zhu, Shanthi Murali, Meryl D Stoller, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 6, 2013
Grain boundary character distribution of nanocrystalline Cu thin films using stereological analysis of transmission electron microscope orientation mapsA D Darbal, K J Ganesh, X Liu, et al.
Pageof 1