Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

K Mingard

Showing results (1-10 of 4) with videos related to

Pageof 1
Sort By:
Ultramicroscopy|May 28, 2021
Correction of artefacts associated with large area EBSDB Winiarski, A Gholinia, K Mingard, et al.
Ultramicroscopy|November 19, 2016
Broad ion beam serial section tomographyB Winiarski, A Gholinia, K Mingard, et al.
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|June 4, 2008
Electron backscatter diffraction as a domain analysis technique in BiFeO(3)-PbTiO(3) single crystalsT L Burnett, T P Comyn, E Merson, et al.
Ultramicroscopy|October 5, 2010
Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patternsT B Britton, C Maurice, R Fortunier, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|May 28, 2021
Correction of artefacts associated with large area EBSDB Winiarski, A Gholinia, K Mingard, et al.
Ultramicroscopy|November 19, 2016
Broad ion beam serial section tomographyB Winiarski, A Gholinia, K Mingard, et al.
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|June 4, 2008
Electron backscatter diffraction as a domain analysis technique in BiFeO(3)-PbTiO(3) single crystalsT L Burnett, T P Comyn, E Merson, et al.
Ultramicroscopy|October 5, 2010
Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patternsT B Britton, C Maurice, R Fortunier, et al.
Pageof 1