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K Mitsuishi

Showing results (1-10 of 29) with videos related to

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 13, 2004
Observation of nanometer-Xe clusters embedded in Al crystalsM Song, K Mitsuishi, K Furuya
Nanotechnology|August 10, 2011
High-resolution electron microscopy of detonation nanodiamondK Iakoubovskii, K Mitsuishi, K Furuya
Nanotechnology|June 30, 2010
Sub-10 nm crystalline silicon nanostructures by electron beam induced deposition lithographyI Sychugov, Y Nakayama, K Mitsuishi
[Kango Gijutsu] : [Nursing Technique]|August 1, 1987
[Nursing of a patient with acute respiratory insufficiency developing after thoracic injuries]Y Atsumi, K Mitsuishi, R Watanabe
Nanotechnology|September 26, 2009
A nanosized photodetector fabricated by electron-beam-induced depositionK Makise, K Mitsuishi, M Shimojo, et al.
Journal of Electron Microscopy|July 27, 2001
New scheme for calculation of annular dark-field STEM image including both elastically diffracted and TDS wavesK Mitsuishi, M Takeguchi, H Yasuda, et al.
Ultramicroscopy|July 23, 2003
Layer-doubling method in ADF-STEM image simulationK Mitsuishi, M Takeguchi, Y Toda, et al.
Microscopy Research and Technique|May 6, 2008
Thickness measurements with electron energy loss spectroscopyK Iakoubovskii, K Mitsuishi, Y Nakayama, et al.
Ultramicroscopy|November 30, 2010
Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopyK Mitsuishi, A Hashimoto, M Takeguchi, et al.
Ultramicroscopy|November 18, 2011
Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopy: II. point spread function analysisK Mitsuishi, A Hashimoto, M Takeguchi, et al.
Pageof 3

Showing results (1-10 of 29) with videos related to

Sort By:
Pageof 3
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 13, 2004
Observation of nanometer-Xe clusters embedded in Al crystalsM Song, K Mitsuishi, K Furuya
Nanotechnology|August 10, 2011
High-resolution electron microscopy of detonation nanodiamondK Iakoubovskii, K Mitsuishi, K Furuya
Nanotechnology|June 30, 2010
Sub-10 nm crystalline silicon nanostructures by electron beam induced deposition lithographyI Sychugov, Y Nakayama, K Mitsuishi
[Kango Gijutsu] : [Nursing Technique]|August 1, 1987
[Nursing of a patient with acute respiratory insufficiency developing after thoracic injuries]Y Atsumi, K Mitsuishi, R Watanabe
Nanotechnology|September 26, 2009
A nanosized photodetector fabricated by electron-beam-induced depositionK Makise, K Mitsuishi, M Shimojo, et al.
Journal of Electron Microscopy|July 27, 2001
New scheme for calculation of annular dark-field STEM image including both elastically diffracted and TDS wavesK Mitsuishi, M Takeguchi, H Yasuda, et al.
Ultramicroscopy|July 23, 2003
Layer-doubling method in ADF-STEM image simulationK Mitsuishi, M Takeguchi, Y Toda, et al.
Microscopy Research and Technique|May 6, 2008
Thickness measurements with electron energy loss spectroscopyK Iakoubovskii, K Mitsuishi, Y Nakayama, et al.
Ultramicroscopy|November 30, 2010
Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopyK Mitsuishi, A Hashimoto, M Takeguchi, et al.
Ultramicroscopy|November 18, 2011
Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopy: II. point spread function analysisK Mitsuishi, A Hashimoto, M Takeguchi, et al.
Pageof 3