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Journal of Microscopy|December 7, 2013
Metrological challenges for reconstruction of 3-D microstructures by focused ion beam tomography methodsK P Mingard, H G Jones, M G GeeUltramicroscopy|February 18, 2014
Investigation of slice thickness and shape milled by a focused ion beam for three-dimensional reconstruction of microstructuresH G Jones, K P Mingard, D C CoxJournal of Microscopy|January 31, 2020
Improving EBSD precision by orientation refinement with full pattern matchingA Winkelmann, B M Jablon, V S Tong, et al.Ultramicroscopy|October 10, 2017
Practical application of direct electron detectors to EBSD mapping in 2D and 3DK P Mingard, M Stewart, M G Gee, et al.Journal of Microscopy|September 1, 2007
Grain size measurement by EBSD in complex hot deformed metal alloy microstructuresK P Mingard, B Roebuck, E G Bennett, et al.Ultramicroscopy|May 4, 2020
Metrology of crystal defects through intensity variations in secondary electrons from the diffraction of primary electrons in a scanning electron microscopeG Naresh-Kumar, A Alasmari, G Kusch, et al.Pageof 1