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Journal of Microscopy|June 5, 2009
Improvement to the scanning electron microscope image colorization by adaptive tuningK S Sim, H Y Ting, M A Lai, et al.Journal of Microscopy|November 20, 2008
Canny optimization technique for electron microscope image colourizationK S Sim, C P Tso, H Y TingJournal of Microscopy|January 26, 2010
Lagrange time delay estimation for scanning electron microscope image magnificationK-S Sim, L W Thong, H Y Ting, et al.Scanning|May 26, 2011
Reducing charging effects in scanning electron microscope images by Rayleigh contrast stretching method (RCS)W Z Wan Ismail, K S Sim, C P Tso, et al.Journal of Medical Systems|August 13, 2010
Single image signal-to-noise ratio estimation for magnetic resonance imagesK S Sim, M A Lai, C P Tso, et al.Journal of Microscopy|September 24, 2009
Gaussian-Taylor signal-to-noise ratio estimation for scanning electron microscope imagesK S Sim, J K Lee, M A Lai, et al.Scanning|July 11, 2012
A contrast stretching bilateral closing top-hat Otsu threshold technique for crack detection in imagesK S Sim, Y Y Kho, C P Tso, et al.Journal of Microscopy|April 14, 2010
Reducing scanning electron microscope charging by using exponential contrast stretching technique on post-processing imagesK S Sim, Y Y Tan, M A Lai, et al.Scanning|March 8, 2011
Image noise cross-correlation for signal-to-noise ratio estimation in scanning electron microscope imagesK S Sim, M E Nia, C P TsoMicroscopy Research and Technique|July 31, 2007
Mixed lagrange time delay estimation autoregressive Wiener filter application for real-time SEM image enhancementK S Sim, K K Law, C P TsoPageof 16