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Biomaterials|September 8, 2001
A model of temperature transients in dental implantsK Wong, A Boyde, P G HowellScanning|February 2, 2000
Surface roughness of preparations for backscattered electron-scanning electron microscopy: the image differences and their Monte Carlo simulationP G Howell, A BoydeScanning|March 11, 1998
Monte Carlo simulation of electron backscattering from compounds with low mean atomic numberP G Howell, A BoydeJournal of Microscopy|September 1, 1986
Simple SEM stereophotogrammetric method for three-dimensional evaluation of features on flat substratesA Boyde, P G Howell, F FrancScanning|October 6, 2001
Light collection efficiency and light transport in backscattered electron scintillator detectors in scanning electron microscopyM N Filippov, E I Rau, R A Sennov, et al.Scanning|January 6, 2001
Correlative light and backscattered electron microscopy of bone--part II: automated image analysisH M Goldman, A Blayvas, A Boyde, et al.Science (New York, N.Y.)|December 13, 1985
Stereoscopic images in confocal (tandem scanning) microscopyA BoydeJournal of Microscopy|February 28, 2018
Evaluation of laser ablation microtomy for correlative microscopy of hard tissuesA BoydeHistochemistry|February 1, 1977
Qualitative electron probe analysis of secretory ameloblasts and odontoblasts in the rat incisorA BoydePageof 565