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Optics Express|September 3, 2009
Characterisation of a resolution enhancing image inversion interferometerKai Wicker, Simon Sindbert, Rainer Heintzmann
Optics Express|June 24, 2009
Interferometric resolution improvement for confocal microscopesKai Wicker, Rainer Heintzmann
Optics Express|August 6, 2009
Simplified approach to diffraction tomography in optical microscopyReto Fiolka, Kai Wicker, Rainer Heintzmann, et al.
Optics Express|February 8, 2013
Phase optimisation for structured illumination microscopyKai Wicker, Ondrej Mandula, Gerrit Best, et al.
Optics Express|November 13, 2013
Full-field dual-color 100-nm super-resolution imaging reveals organization and dynamics of mitochondrial and ER networksMaia Brunstein, Kai Wicker, Karine Hérault, et al.
Optics Express|September 24, 2016
Motion artefact detection in structured illumination microscopy for live cell imagingRonny Förster, Kai Wicker, Walter Müller, et al.
Optics Express|November 29, 2012
Line scan--structured illumination microscopy super-resolution imaging in thick fluorescent samplesOndrej Mandula, Martin Kielhorn, Kai Wicker, et al.
Optics Express|October 17, 2014
Simple structured illumination microscope setup with high acquisition speed by using a spatial light modulatorRonny Förster, Hui-Wen Lu-Walther, Aurélie Jost, et al.
Optics Express|July 14, 2016
Deconvolution approach for 3D scanning microscopy with helical phase engineeringClemens Roider, Rainer Heintzmann, Rafael Piestun, et al.
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