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The Review of Scientific Instruments|January 1, 2008
Portable x-ray fluorescence spectrometer for coating thickness measurementAlain Carapelle, Karl Fleury-Frenette, Jean-Paul Collette, et al.Applied Optics|February 3, 2016
Real-time measurement of temperature variation during nanosecond pulsed-laser-induced contamination depositionDimitrios Kokkinos, Patrick Gailly, Marc P Georges, et al.Pageof 1