Portable x-ray fluorescence spectrometer for coating thickness measurement

Area of Science:

• Materials Science
• Analytical Chemistry
• Instrumentation Engineering

Background:

• Accurate coating thickness measurement is crucial for industrial quality control.
• Existing methods may lack portability or require specialized operators.
• The need for rapid, on-site analysis of thin films is increasing.

Purpose of the Study:

• To develop and validate a handheld x-ray spectrometer for industrial coating thickness measurements.
• To achieve high accuracy (approx. 3%) for coatings in the 1-1500 nm range.
• To design the system for user-friendliness by non-specialist personnel.

Main Methods:

• Development of a portable x-ray spectrometer system.
• Implementation of automated software for data acquisition and analysis.
• Integration of an automated calibration routine using reference standards.
• Testing and validation of the device on coated samples within the target thickness range.

Main Results:

• Successful realization and testing of the handheld x-ray spectrometer.
• Achieved measurement accuracy of approximately 3% for coating thicknesses from 1 to 1500 nm.
• Demonstrated a measurement time of only 1 minute per sample.
• Validated the effectiveness of the automated software and calibration for non-specialist operation.

Conclusions:

• The developed handheld x-ray spectrometer is a viable tool for accurate and rapid industrial coating thickness analysis.
• The automated features enhance usability, making advanced measurement technology accessible to a broader range of industrial users.
• This instrument offers a practical solution for on-site quality control of thin film coatings.