Portable x-ray fluorescence spectrometer for coating thickness measurement
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Updated: Jul 8, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
Alain Carapelle1, Karl Fleury-Frenette, Jean-Paul Collette
1Centre Spatial de Liège, University of Liège, Avenue de Pre-Ally, Liege Science Park, 4031 Angleur, Belgium. a.carapelle@ulg.be
Abstract:
A handheld x-ray spectrometer has been realized and tested. The purpose of the device is to measure the thickness of coated samples in the range of 1-1500 nm in an industrial environment. Accuracy of approximately 3% has been achieved in this range with a measurement time of 1 min. Automated software has been implemented to allow utilization by a nonspecialist operator. An automated calibration procedure, based on measurements of reference samples, is used.
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