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IEEE Transactions on Pattern Analysis and Machine Intelligence
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November 17, 2006
A statistics-based approach to binary image registration with uncertainty analysis
Katherine M Simonson, Steven M Drescher, Franklin R Tanner
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of 1
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Showing results (1-10 of 1) with videos related to
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IEEE Transactions on Pattern Analysis and Machine Intelligence
|
November 17, 2006
A statistics-based approach to binary image registration with uncertainty analysis
Katherine M Simonson, Steven M Drescher, Franklin R Tanner
Page
of 1