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Journal of Electron Microscopy|June 17, 2010
Discontinuous coarsening behavior of Ni(2)MnAl intermetallic compound during isothermal aging treatment of Fe-Mn-Ni-Al alloysYoon-Uk Heo, Masaki Takeguchi, Kazuo Furuya, et al.
Journal of Electron Microscopy|December 18, 2007
Sample preparation of GaN-based materials on a sapphire substrate for STEM analysisHanako Okuno, Masaki Takeguchi, Kazutaka Mitsuishi, et al.
Journal of Electron Microscopy|June 8, 2004
Detection of iron-oxide layer on the surface of iron nitride using high-resolution electron microscopy and Fourier filteringZhi-Quan Liu, Minghui Song, Kazutaka Mitsuishi, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 17, 2009
TEM sample preparation using a new nanofabrication technique combining electron-beam-induced deposition and low-energy ion millingKazutaka Mitsuishi, Masayuki Shimojo, Miyoko Tanaka, et al.
Ultramicroscopy|October 28, 2008
Quantitative structural analysis of twin boundary in alpha-Zn7Sb2O12 using HAADF STEM methodKoji Kuramochi, Kentaro Suzuki, Takashi Yamazaki, et al.
Journal of Electron Microscopy|June 8, 2004
Electron microscopy observation of interface in diffusion-bonded copper jointAiru Wang, Osamu Ohashi, Norio Yamaguchi, et al.
The Journal of Chemical Physics|November 15, 2006
Second-harmonic spectroscopy of surface immobilized gold nanospheres above a gold surface supported by self-assembled monolayersKazuma Tsuboi, Shinya Abe, Shinya Fukuba, et al.
Science (New York, N.Y.)|March 23, 2002
Ordering in a fluid inert gas confined by flat surfacesStephen E Donnelly, Robert C Birtcher, Charles W Allen, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 17, 2009
Ultrahigh-vacuum third-order spherical aberration (Cs) corrector for a scanning transmission electron microscopeKazutaka Mitsuishi, Masaki Takeguchi, Yukihito Kondo, et al.
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